Yasuji Yoneda

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Connection/inspection device for semiconductor elements
- Patent number 6,815,962
- Issue date Nov 9, 2004
- Kabushiki Kaisha Kobe Seiko Sho.
- Takayuki Hirano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electric connection-inspection device
- Publication number 20030034782
- Publication date Feb 20, 2003
- Takayuki Hirano
- G01 - MEASURING TESTING