Yasujiro Yamada

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,921,065
- Issue date Mar 5, 2024
- Rigaku Corporation
- Shinya Hara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer and control method for x-ray fluore...
- Patent number 11,698,352
- Issue date Jul 11, 2023
- Rigaku Corporation
- Yoshihisa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,656,190
- Issue date May 23, 2023
- Rigaku Corporation
- Shinya Hara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,156,569
- Issue date Oct 26, 2021
- Rigaku Corporation
- Yasujiro Yamada
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 10,161,889
- Issue date Dec 25, 2018
- Rigaku Corporation
- Shinya Hara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 10,082,475
- Issue date Sep 25, 2018
- Rigaku Corporation
- Shinya Hara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 10,012,605
- Issue date Jul 3, 2018
- Rigaku Corporation
- Yasujiro Yamada
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzing method
- Patent number 8,433,035
- Issue date Apr 30, 2013
- Rigaku Corporation
- Kenji Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer and program for use therewith
- Patent number 7,450,685
- Issue date Nov 11, 2008
- Rigaku Industrial Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 6,668,038
- Issue date Dec 23, 2003
- Rigaku Industrial Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 6,647,090
- Issue date Nov 11, 2003
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzer useable as wavelength dispersive type an...
- Patent number 6,292,532
- Issue date Sep 18, 2001
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20230393084
- Publication date Dec 7, 2023
- Rigaku Corporation
- Shinya HARA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20230044361
- Publication date Feb 9, 2023
- Rigaku Corporation
- Shinya HARA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER AND CONTROL METHOD FOR X-RAY FLUORE...
- Publication number 20220349847
- Publication date Nov 3, 2022
- Yoshihisa YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20210262954
- Publication date Aug 26, 2021
- Rigaku Corporation
- Yasujiro YAMADA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20180180563
- Publication date Jun 28, 2018
- Rigaku Corporation
- Shinya HARA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20180106736
- Publication date Apr 19, 2018
- Rigaku Corporation
- Shinya HARA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20170322165
- Publication date Nov 9, 2017
- Rigaku Corporation
- Yasujiro YAMADA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZING METHOD
- Publication number 20110243301
- Publication date Oct 6, 2011
- Rigaku Corporation
- Kenji Watanabe
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence spectrometer and program for use therewith
- Publication number 20070086567
- Publication date Apr 19, 2007
- RIGAKU INDUSTRIAL CORPORATION
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescense spectrometer
- Publication number 20030118148
- Publication date Jun 26, 2003
- RIGAKU INDUSTRIAL CORPORATION
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence spectrometer
- Publication number 20020172322
- Publication date Nov 21, 2002
- Naoki Kawahara
- G01 - MEASURING TESTING

Yasujiro Yamada

Person

Patents Grantslast 30 patents

X-ray fluorescence spectrometer

X-ray fluorescence spectrometer and control method for x-ray fluore...

X-ray fluorescence spectrometer

X-ray fluorescence spectrometer

X-ray fluorescence spectrometer

X-ray fluorescence spectrometer

X-ray fluorescence spectrometer

X-ray fluorescence analyzing method

X-ray fluorescence spectrometer and program for use therewith

X-ray fluorescence spectrometer

X-ray fluorescence spectrometer

Fluorescent X-ray analyzer useable as wavelength dispersive type an...

Patents Applicationslast 30 patents

X-RAY FLUORESCENCE SPECTROMETER

X-RAY FLUORESCENCE SPECTROMETER

X-RAY FLUORESCENCE SPECTROMETER AND CONTROL METHOD FOR X-RAY FLUORE...

X-RAY FLUORESCENCE SPECTROMETER

X-RAY FLUORESCENCE SPECTROMETER

X-RAY FLUORESCENCE SPECTROMETER

X-RAY FLUORESCENCE SPECTROMETER

X-RAY FLUORESCENCE ANALYZING METHOD

X-ray fluorescence spectrometer and program for use therewith

X-ray fluorescense spectrometer

X-ray fluorescence spectrometer