Membership
Tour
Register
Log in
Yasukazu Mukogawa
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Ultrapure water producing apparatus
Patent number
6,733,661
Issue date
May 11, 2004
Renesas Technology Corp.
Yasukazu Mukogawa
C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information
Patent Grant
System for analyzing a failure in a semiconductor wafer by calculat...
Patent number
6,009,545
Issue date
Dec 28, 1999
Mitsubishi Denki Kabushiki Kaisha
Toshikazu Tsutsui
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for identifying an identification mark of a wafer
Patent number
5,942,763
Issue date
Aug 24, 1999
Mitsubishi Denki Kabushiki Kaisha
Yasukazu Mukogawa
G01 - MEASURING TESTING
Information
Patent Grant
Monocrystalline silicon wafer and method of thermally oxidizing a s...
Patent number
5,928,786
Issue date
Jul 27, 1999
Mitsubishi Denki Kabushiki Kaisha
Yasukazu Mukogawa
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Crystal orientation detectable semiconductor substrate, and methods...
Patent number
5,876,819
Issue date
Mar 2, 1999
Mitsubishi Denki Kabushiki Kaisha
Yasuhiro Kimura
C30 - CRYSTAL GROWTH
Information
Patent Grant
Apparatus for analyzing a failure in a semiconductor wafer and meth...
Patent number
5,844,850
Issue date
Dec 1, 1998
Mitsubishi Denki Kabushiki Kaisha
Toshikazu Tsutsui
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cleaning apparatus
Patent number
5,511,569
Issue date
Apr 30, 1996
Mitsubishi Denki Kabushiki Kaisha
Yasukazu Mukogawa
B08 - CLEANING
Information
Patent Grant
Semiconductor device resistant to slip line formation
Patent number
5,331,193
Issue date
Jul 19, 1994
Mitsubishi Denki Kabushiki Kaisha
Yasukazu Mukogawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for measuring impurities in pure water
Patent number
4,786,473
Issue date
Nov 22, 1988
Mitsubishi Denki Kabushiki Kaisha
Yasukazu Mukogawa
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring impurities in water
Patent number
4,765,963
Issue date
Aug 23, 1988
Mitsubishi Denki Kabushiki Kaisha
Yasukazu Mukogawa
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring the absolute value of the density of salts in...
Patent number
4,569,224
Issue date
Feb 11, 1986
Mitsubishi Denki Kabushiki Kaisha
Takaaki Fukumoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Ultrapure water producing apparatus
Publication number
20020134722
Publication date
Sep 26, 2002
Mitsubishi Denki Kabushiki Kaisha
Yasukazu Mukogawa
C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE