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Yasukazu NAKAYE
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Detector
Patent number
11,049,897
Issue date
Jun 29, 2021
Rigaku Corporation
Takuto Sakumura
G01 - MEASURING TESTING
Information
Patent Grant
Processing apparatus, method, and program
Patent number
10,748,253
Issue date
Aug 18, 2020
Rigaku Corporation
Takuto Sakumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Data processing apparatus, method of obtaining characteristic of ea...
Patent number
10,551,510
Issue date
Feb 4, 2020
Rigaku Corporation
Takuto Sakumura
G01 - MEASURING TESTING
Information
Patent Grant
X-ray data processing apparatus and method and program for the same
Patent number
10,222,491
Issue date
Mar 5, 2019
Rigaku Corporation
Kazuyuki Matsushita
G01 - MEASURING TESTING
Information
Patent Grant
X-ray data processing apparatus, X-ray data processing method, and...
Patent number
10,209,375
Issue date
Feb 19, 2019
Rigaku Corporation
Kazuyuki Matsushita
G01 - MEASURING TESTING
Information
Patent Grant
X-ray data processing apparatus and method and program therefor
Patent number
10,101,476
Issue date
Oct 16, 2018
Rigaku Corporation
Takuto Sakumura
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detector, and X-ray analysis apparatus and radiation dete...
Patent number
9,945,961
Issue date
Apr 17, 2018
Rigaku Corporation
Takuto Sakumura
G01 - MEASURING TESTING
Information
Patent Grant
Image processing method and image processing apparatus
Patent number
9,558,582
Issue date
Jan 31, 2017
Rigaku Corporation
Takuto Sakumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Correction information generation method and correction information...
Patent number
9,341,583
Issue date
May 17, 2016
Rigaku Corporation
Takuto Sakumura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RADIATION DETECTOR, RADIATION MEASURING APPARATUS, AND METHOD FOR S...
Publication number
20240280714
Publication date
Aug 22, 2024
Rigaku Corporation
Kunitoshi YANAGIHARA
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR, TRIGGER SIGNAL GENERATOR, AND RADIATION ANALYZI...
Publication number
20240280711
Publication date
Aug 22, 2024
Rigaku Corporation
Yasutaka SAKUMA
G01 - MEASURING TESTING
Information
Patent Application
CONTROL APPARATUS, SYSTEM, METHOD, AND PROGRAM
Publication number
20230115151
Publication date
Apr 13, 2023
Rigaku Corporation
Takuto SAKUMURA
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR
Publication number
20190245000
Publication date
Aug 8, 2019
Rigaku Corporation
TAKUTO SAKUMURA
G01 - MEASURING TESTING
Information
Patent Application
PROCESSING APPARATUS, METHOD, AND PROGRAM
Publication number
20190114746
Publication date
Apr 18, 2019
Rigaku Corporation
Takuto SAKUMURA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DATA PROCESSING APPARATUS, METHOD OF OBTAINING CHARACTERISTIC OF EA...
Publication number
20180203132
Publication date
Jul 19, 2018
Rigaku Corporation
Takuto SAKUMURA
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR, AND X-RAY ANALYSIS APPARATUS AND RADIATION DETE...
Publication number
20170371044
Publication date
Dec 28, 2017
Rigaku Corporation
Takuto SAKUMURA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DATA PROCESSING APPARATUS AND METHOD AND PROGRAM FOR THE SAME
Publication number
20160377749
Publication date
Dec 29, 2016
Rigaku Corporation
Kazuyuki MATSUSHITA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DATA PROCESSING APPARATUS AND METHOD AND PROGRAM THEREFOR
Publication number
20160377748
Publication date
Dec 29, 2016
Rigaku Corporation
Takuto SAKUMURA
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PROCESSING METHOD AND IMAGE PROCESSING APPARATUS
Publication number
20150213623
Publication date
Jul 30, 2015
Rigaku Corporation
Takuto SAKUMURA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADIATION DETECTOR, AND X-RAY ANALYSIS APPARATUS AND RADIATION DETE...
Publication number
20150212213
Publication date
Jul 30, 2015
Rigaku Corporation
Takuto SAKUMURA
G01 - MEASURING TESTING
Information
Patent Application
CORRECTION INFORMATION GENERATION METHOD AND CORRECTION INFORMATION...
Publication number
20150146960
Publication date
May 28, 2015
Rigaku Corporation
Takuto SAKUMURA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DATA PROCESSING APPARATUS, X-RAY DATA PROCESSING METHOD, AND...
Publication number
20140236523
Publication date
Aug 21, 2014
Rigaku Corporation
Kazuyuki MATSUSHITA
G01 - MEASURING TESTING