Yasukazu Ono

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Kasugai, JP

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Patents Grantslast 30 patents

Information Patent Grant
Control method and control program for prober
- Patent number 7,768,279
- Issue date Aug 3, 2010
- Fujitsu Semiconductor Limited
- Yasukazu Ono
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing probe needle, method for manufacturing pro...
- Patent number 7,150,095
- Issue date Dec 19, 2006
- Fujitsu Limited
- Yasukazu Ono
- G01 - MEASURING TESTING
Information Patent Grant
Band distribution inspecting device and band distribution inspectin...
- Patent number 7,071,675
- Issue date Jul 4, 2006
- Fujitsu Limited
- Yasukazu Ono
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Control method and control program for prober
- Publication number 20070296430
- Publication date Dec 27, 2007
- FUJITSU LIMITED
- Yasukazu Ono
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing probe needle, method for manufacturing pro...
- Publication number 20060042077
- Publication date Mar 2, 2006
- FUJITSU LIMITED
- Yasukazu Ono
- G01 - MEASURING TESTING
Information Patent Application
Band distribution inspecting device and band distribution inspectin...
- Publication number 20050057241
- Publication date Mar 17, 2005
- FUJITSU LIMITED
- Yasukazu Ono
- G01 - MEASURING TESTING