Yasuko Aoki

Person

Hitachi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection device, inspection method, and X-ray detector
- Patent number 9,506,876
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Device for detecting foreign matter and method for detecting foreig...
- Patent number 9,164,042
- Issue date Oct 20, 2015
- Hitachi High-Technologies Corporation
- Kenji Aiko
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,629,395
- Issue date Jan 14, 2014
- Hitachi High-Technologies Corporation
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 8,455,823
- Issue date Jun 4, 2013
- Hitachi High-Technologies Corporation
- Takashi Ichimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,705,302
- Issue date Apr 27, 2010
- Hitachi High-Technologies Corporation
- Yasuko Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for electron-beam lithography
- Patent number 7,342,241
- Issue date Mar 11, 2008
- Hitachi High-Technologies Corporation
- Yasuko Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-destructive inspection apparatus and inspection system using it
- Patent number 6,333,962
- Issue date Dec 25, 2001
- Hitachi, Ltd.
- Hiroshi Kitaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection apparatus and inspection system using it
- Patent number 6,049,586
- Issue date Apr 11, 2000
- Hitachi, Ltd.
- Hiroshi Kitaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection apparatus and inspection system using it
- Patent number 5,933,473
- Issue date Aug 3, 1999
- Hitachi, Ltd.
- Hiroshi Kitaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Nuclear power plant having a water chemistry control system for a p...
- Patent number 5,398,268
- Issue date Mar 14, 1995
- Hitachi, Ltd.
- Hidefumi Ibe
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
Defect Determining Method and X-Ray Inspection Device
- Publication number 20180209924
- Publication date Jul 26, 2018
- Hitachi High-Technologies Corporation
- Hideaki SASAZAWA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE, INSPECTION METHOD, AND X-RAY DETECTOR
- Publication number 20140328459
- Publication date Nov 6, 2014
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR DETECTING FOREIGN MATTER AND METHOD FOR DETECTING FOREIG...
- Publication number 20130320216
- Publication date Dec 5, 2013
- Hitachi High-Technologies Corporation
- Kenji Aiko
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20120298864
- Publication date Nov 29, 2012
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20110233399
- Publication date Sep 29, 2011
- Takashi Ichimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope
- Publication number 20080191135
- Publication date Aug 14, 2008
- Hitachi High-Technologies Corporation
- Yasuko Aoki
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for electron-beam lithography
- Publication number 20060011080
- Publication date Jan 19, 2006
- Hitachi High-Technologies Corporation
- Yasuko Aoki
- B82 - NANO-TECHNOLOGY

Yasuko Aoki

Person

Patents Grantslast 30 patents

X-ray inspection device, inspection method, and X-ray detector

Device for detecting foreign matter and method for detecting foreig...

Charged particle beam apparatus

Charged particle beam device

Scanning electron microscope

Method and apparatus for electron-beam lithography

Non-destructive inspection apparatus and inspection system using it

Non-destructive inspection apparatus and inspection system using it

Non-destructive inspection apparatus and inspection system using it

Nuclear power plant having a water chemistry control system for a p...

Patents Applicationslast 30 patents

Defect Determining Method and X-Ray Inspection Device

X-RAY INSPECTION DEVICE, INSPECTION METHOD, AND X-RAY DETECTOR

DEVICE FOR DETECTING FOREIGN MATTER AND METHOD FOR DETECTING FOREIG...

Charged Particle Beam Apparatus

CHARGED PARTICLE BEAM DEVICE

Scanning Electron Microscope

Method and apparatus for electron-beam lithography