Yasukuni NOMURA

Person

  • Tokyo, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Measuring method

    • Patent number 12,181,267
    • Issue date Dec 31, 2024
    • Disco Corporation
    • Yasukuni Nomura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Notch detecting method

    • Patent number 11,935,227
    • Issue date Mar 19, 2024
    • Disco Corporation
    • Yasukuni Nomura
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Wafer inspecting apparatus

    • Patent number 11,232,551
    • Issue date Jan 25, 2022
    • Disco Corporation
    • Shinji Yoshida
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

  • Information Patent Application

    MEASURING METHOD

    • Publication number 20230243639
    • Publication date Aug 3, 2023
    • Disco Corporation
    • Yasukuni NOMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    NOTCH DETECTING METHOD

    • Publication number 20220138922
    • Publication date May 5, 2022
    • Disco Corporation
    • Yasukuni NOMURA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    WAFER INSPECTING APPARATUS

    • Publication number 20210012482
    • Publication date Jan 14, 2021
    • Disco Corporation
    • Shinji YOSHIDA
    • G06 - COMPUTING CALCULATING COUNTING