Yasumaro Komiya

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Yokohama, JP

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Patents Applicationslast 30 patents

Information Patent Application
Defect analyzing device for semiconductor integrated circuits, syst...
- Publication number 20060164115
- Publication date Jul 27, 2006
- Yasumaro Komiya
- G01 - MEASURING TESTING
Information Patent Application
Defect diagnosis method and apparatus for semiconductor integrated...
- Publication number 20060017455
- Publication date Jan 26, 2006
- Shuji Kikuchi
- G01 - MEASURING TESTING