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Yasunao AWATA

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  • Yokohama, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,580,196
    • Issue date Nov 12, 2013
    • Hitachi High-Technologies Corporation
    • Yasunao Awata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,409,507
    • Issue date Apr 2, 2013
    • Hitachi High-Technologies Corporation
    • Hirokazu Iwamatsu
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20080240989
    • Publication date Oct 2, 2008
    • Hirokazu IWAMATSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20080056939
    • Publication date Mar 6, 2008
    • Yasunao AWATA
    • G01 - MEASURING TESTING