Yasunari Kanzawa

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Implementing hierarchical design-for-test logic for modular circuit...
- Patent number 8,065,651
- Issue date Nov 22, 2011
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Increasing scan compression by using X-chains
- Patent number 7,958,472
- Issue date Jun 7, 2011
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR IMPLEMENTING A HIERARCHICAL DESIGN-FOR-TES...
- Publication number 20100192030
- Publication date Jul 29, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Increasing Scan Compression By Using X-Chains
- Publication number 20100083199
- Publication date Apr 1, 2010
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING