Yasunari Kawaguchi

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory device, test circuit and test method
- Patent number 7,652,943
- Issue date Jan 26, 2010
- NEC Electronics Corporation
- Hiroyuki Takahashi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having a DRAM cell structure and handle...
- Patent number 6,868,027
- Issue date Mar 15, 2005
- NEC Electronics Corporation
- Yasunari Kawaguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
SRAM generating an echo clock signal
- Patent number 6,278,637
- Issue date Aug 21, 2001
- NEC Corporation
- Yasunari Kawaguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Burst mode type semiconductor memory device
- Patent number 6,138,205
- Issue date Oct 24, 2000
- NEC Corporation
- Yasunari Kawaguchi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor memory device, test circuit and test method
- Publication number 20060039220
- Publication date Feb 23, 2006
- NEC Electronics Corporation
- Hiroyuki Takahashi
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device having a DRAM cell structure and handle...
- Publication number 20040130959
- Publication date Jul 8, 2004
- NEC Electronics Corporation
- Yasunari Kawaguchi
- G11 - INFORMATION STORAGE