Yasunori Asano

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Ayabe, JP

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Patents Grantslast 30 patents

Information Patent Grant
Substrate inspection method and apparatus
- Patent number 7,512,260
- Issue date Mar 31, 2009
- Omron Corporation
- Kiyoshi Murakami
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Substrate inspection method and apparatus
- Publication number 20060050267
- Publication date Mar 9, 2006
- Kiyoshi Murakami
- G06 - COMPUTING CALCULATING COUNTING