Yasunori Doi

Person

Nasushiobara, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Attached matter testing device and testing method
- Patent number 9,696,288
- Issue date Jul 4, 2017
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Medical information display apparatus
- Patent number 9,679,106
- Issue date Jun 13, 2017
- Toshiba Medical Systems Corporation
- Yosuke Yanagida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis device and analysis method
- Patent number 9,214,324
- Issue date Dec 15, 2015
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 9,040,905
- Issue date May 26, 2015
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,569,719
- Issue date Oct 29, 2013
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,405,053
- Issue date Mar 26, 2013
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,999,240
- Issue date Aug 16, 2011
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,791,050
- Issue date Sep 7, 2010
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam apparatus for specimen fabrication
- Patent number 7,525,108
- Issue date Apr 28, 2009
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,397,051
- Issue date Jul 8, 2008
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,397,050
- Issue date Jul 8, 2008
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,397,052
- Issue date Jul 8, 2008
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,176,458
- Issue date Feb 13, 2007
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,138,628
- Issue date Nov 21, 2006
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,071,475
- Issue date Jul 4, 2006
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 6,828,566
- Issue date Dec 7, 2004
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for sample fabrication
- Patent number 6,538,254
- Issue date Mar 25, 2003
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Positive resist composition
- Patent number 6,383,708
- Issue date May 7, 2002
- Sumitomo Chemical Company, Limited
- Yasunori Uetani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Radiation-sensitive positive resist composition
- Patent number 5,792,585
- Issue date Aug 11, 1998
- Sumitomo Chemical Company, Limited
- Ayako Ida
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Radiation-sensitive positive resist composition
- Patent number 5,783,355
- Issue date Jul 21, 1998
- Sumitomo Chemical Company, Limited
- Ayako Ida
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Radiation-sensitive positive resist composition comprising an alkal...
- Patent number 5,736,292
- Issue date Apr 7, 1998
- Sumitomo Chemical Company, Limited
- Ayako Ida
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Radiation-sensitive positive resist composition comprising an alkal...
- Patent number 5,407,780
- Issue date Apr 18, 1995
- Sumitomo Chemical Company, Limited
- Takeshi Hioki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Radiation-sensitive positive resist composition comprising an alkal...
- Patent number 5,403,696
- Issue date Apr 4, 1995
- Sumitomo Chemical Company, Limited
- Takeshi Hioki
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Positive quinonediazide resist composition utilizing mixed solvent...
- Patent number 5,336,583
- Issue date Aug 9, 1994
- Sumitomo Chemical Company, Limited
- Yasunori Uetani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Positive resist composition comprising an alkali-soluble resin and...
- Patent number 5,283,155
- Issue date Feb 1, 1994
- Sumitomo Chemical Company, Limited
- Yasunori Uetani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process for preparing radiation sensitive compound and positive res...
- Patent number 5,283,324
- Issue date Feb 1, 1994
- Sumitomo Chemical Company, Limited
- Jun Tomioka
- C07 - ORGANIC CHEMISTRY

Patents Applicationslast 30 patents

Information Patent Application
MEDICAL INFORMATION DISPLAY APPARATUS
- Publication number 20150243065
- Publication date Aug 27, 2015
- KABUSHIKI KAISHA TOSHIBA
- Yosuke YANAGIDA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20150235831
- Publication date Aug 20, 2015
- Hitachi, Ltd
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATTACHED MATTER TESTING DEVICE AND TESTING METHOD
- Publication number 20140238106
- Publication date Aug 28, 2014
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20140151543
- Publication date Jun 5, 2014
- Hitachi, Ltd
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20120085924
- Publication date Apr 12, 2012
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20110140006
- Publication date Jun 16, 2011
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20090008578
- Publication date Jan 8, 2009
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20080296516
- Publication date Dec 4, 2008
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20080296497
- Publication date Dec 4, 2008
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20070145300
- Publication date Jun 28, 2007
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20070145302
- Publication date Jun 28, 2007
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20070145299
- Publication date Jun 28, 2007
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20070145301
- Publication date Jun 28, 2007
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20060231776
- Publication date Oct 19, 2006
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20060192099
- Publication date Aug 31, 2006
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20050054029
- Publication date Mar 10, 2005
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20030183776
- Publication date Oct 2, 2003
- Satoshi Tomimatsu
- G01 - MEASURING TESTING

Yasunori Doi

Person

Patents Grantslast 30 patents

Attached matter testing device and testing method

Medical information display apparatus

Analysis device and analysis method

Analysis device and analysis method

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Focused ion beam apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for sample fabrication

Positive resist composition

Radiation-sensitive positive resist composition

Radiation-sensitive positive resist composition

Radiation-sensitive positive resist composition comprising an alkal...

Radiation-sensitive positive resist composition comprising an alkal...

Radiation-sensitive positive resist composition comprising an alkal...

Positive quinonediazide resist composition utilizing mixed solvent...

Positive resist composition comprising an alkali-soluble resin and...

Process for preparing radiation sensitive compound and positive res...

Patents Applicationslast 30 patents

MEDICAL INFORMATION DISPLAY APPARATUS

ANALYSIS DEVICE AND ANALYSIS METHOD

ATTACHED MATTER TESTING DEVICE AND TESTING METHOD

ANALYSIS DEVICE AND ANALYSIS METHOD

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication