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Yasunori Ikeno
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor wafer inspection apparatus
Patent number
7,102,743
Issue date
Sep 5, 2006
Olympus Corporation
Haruyuki Tsuji
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MICROSCOPE SYSTEM
Publication number
20150130923
Publication date
May 14, 2015
OLYMPUS CORPORATION
Mina KOBAYASHI
G02 - OPTICS
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Patent Application
MICROSCOPE-IMAGE DISPLAY CONTROL METHOD, COMPUTER-READABLE RECORDIN...
Publication number
20150135140
Publication date
May 14, 2015
OLYMPUS CORPORATION
Mina KOBAYASHI
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
IMAGE SCAN METHOD, SYSTEM AND COMPUTER READABLE MEDIUM
Publication number
20130259319
Publication date
Oct 3, 2013
OLYMPUS CORPORATION
Murthy Vinjamuri
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor wafer inspection apparatus
Publication number
20050062960
Publication date
Mar 24, 2005
Olympus Optical Co., Ltd.
Haruyuki Tsuji
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor wafer inspection apparatus
Publication number
20030202178
Publication date
Oct 30, 2003
Olympus Optical Co., Ltd.
Haruyuki Tsuji
G01 - MEASURING TESTING