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KANAGAWA, JP
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Patents Grants
last 30 patents
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Patent Grant
Method for measuring magnetic characteristics, apparatus for measur...
Patent number
11,860,248
Issue date
Jan 2, 2024
Sony Corporation
Akifumi Ono
G01 - MEASURING TESTING
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Patent Grant
Detection apparatus and method of producing electronic apparatus
Patent number
11,598,715
Issue date
Mar 7, 2023
Sony Corporation
Yasunori Imai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD FOR MEASURING MAGNETIC CHARACTERISTICS, APPARATUS FOR MEASUR...
Publication number
20220221531
Publication date
Jul 14, 2022
SONY CORPORATION
Akifumi ONO
G01 - MEASURING TESTING
Information
Patent Application
DETECTION APPARATUS AND METHOD OF PRODUCING ELECTRONIC APPARATUS
Publication number
20210372778
Publication date
Dec 2, 2021
SONY CORPORATION
YASUNORI IMAI
H04 - ELECTRIC COMMUNICATION TECHNIQUE