Yasuo SATO

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Fukuoka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test pattern generation device, fault detection system, test patter...
- Patent number 9,702,927
- Issue date Jul 11, 2017
- Japan Science and Technology Agency
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Fault detection system, generation circuit, and program
- Patent number 9,383,408
- Issue date Jul 5, 2016
- Japan Science and Technology Agency
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, detection method and program
- Patent number 9,316,684
- Issue date Apr 19, 2016
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Fault detection system, acquisition apparatus, fault detection meth...
- Patent number 9,075,110
- Issue date Jul 7, 2015
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generation for semiconductor integrated circuit
- Patent number 8,959,001
- Issue date Feb 17, 2015
- National University Corporation Nara Institute of Science and Technology
- Michiko Inoue
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FAULT DETECTION SYSTEM, GENERATION CIRCUIT, AND PROGRAM
- Publication number 20150247898
- Publication date Sep 3, 2015
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN GENERATION DEVICE, FAULT DETECTION SYSTEM, TEST PATTER...
- Publication number 20150006102
- Publication date Jan 1, 2015
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Application
FAULT DETECTION SYSTEM, ACQUISITION APPARATUS, FAULT DETECTION METH...
- Publication number 20130205180
- Publication date Aug 8, 2013
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, DETECTION METHOD AND PROGRAM
- Publication number 20130013247
- Publication date Jan 10, 2013
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN GENERATION FOR SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20120283981
- Publication date Nov 8, 2012
- KYUSHU INSTITUTE OF TECHNOLOGY
- Michiko INOUE
- G01 - MEASURING TESTING