TREA

Yasuo TOKUNAGA

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Patents Grantslast 30 patents

  • Information Patent Grant

    Test wafer unit and test system
    • Patent number 8,749,260
    • Issue date Jun 10, 2014
    • Advantest Corporation
    • Yasuo Tokunaga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test system and write wafer
    • Patent number 8,624,620
    • Issue date Jan 7, 2014
    • Advantest Corporation
    • Yasuo Tokunaga
    • G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

  • Information Patent Application

    TEST WAFER UNIT AND TEST SYSTEM
    • Publication number 20110133768
    • Publication date Jun 9, 2011
    • Advantest Corporation
    • Yasuo TOKUNAGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST SYSTEM AND WRITE WAFER
    • Publication number 20110115519
    • Publication date May 19, 2011
    • Advantest Corporation
    • Yasuo TOKUNAGA
    • G01 - MEASURING TESTING