Yasuo Tsukuda

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Analysis device, analysis method, trace liquid collection device, a...
- Patent number 12,163,885
- Issue date Dec 10, 2024
- Shimadzu Corporation
- Yasuo Tsukuda
- G01 - MEASURING TESTING
Information Patent Grant
Polishing state monitoring method
- Patent number 8,342,907
- Issue date Jan 1, 2013
- Ebara Corporation
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Spectrophotometer
- Patent number 8,049,884
- Issue date Nov 1, 2011
- Shimadzu Corporation
- Yasuo Tsukuda
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device for trace liquid sample
- Patent number 7,830,520
- Issue date Nov 9, 2010
- Shimadzu Corporation
- Yasuo Tsukuda
- G01 - MEASURING TESTING
Information Patent Grant
Polishing state monitoring apparatus and polishing apparatus
- Patent number 7,645,181
- Issue date Jan 12, 2010
- Ebara Corporation
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Substrate polishing apparatus
- Patent number 7,585,204
- Issue date Sep 8, 2009
- Ebara Corporation
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Spectrophotometric method and apparatus
- Patent number 7,576,855
- Issue date Aug 18, 2009
- Shimadzu Corporation
- Yasuo Tsukuda
- G01 - MEASURING TESTING
Information Patent Grant
Substrate polishing apparatus
- Patent number 7,547,242
- Issue date Jun 16, 2009
- Ebara Corporation
- Kazuto Hirokawa
- B24 - GRINDING POLISHING
Information Patent Grant
Substrate polishing apparatus
- Patent number 7,510,460
- Issue date Mar 31, 2009
- Ebara Corporation
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing state monitoring method
- Patent number 7,438,627
- Issue date Oct 21, 2008
- Ebara Corporation
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing state monitoring apparatus and polishing apparatus and me...
- Patent number 7,252,575
- Issue date Aug 7, 2007
- Ebara Corporation
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Substrate polishing apparatus
- Patent number 7,241,202
- Issue date Jul 10, 2007
- Ebara Corporation
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Substrate polishing apparatus
- Patent number 7,101,257
- Issue date Sep 5, 2006
- Ebara Corporation
- Kazuto Hirokawa
- B24 - GRINDING POLISHING
Information Patent Grant
Substrate polishing apparatus
- Patent number 6,942,543
- Issue date Sep 13, 2005
- Ebara Corporation
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Substrate polishing apparatus
- Patent number 6,758,723
- Issue date Jul 6, 2004
- Ebara Corporation
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Grant
Infrared light source
- Patent number 5,731,594
- Issue date Mar 24, 1998
- Shimadzu Corporation
- Shin-ichi Kuroda
- G01 - MEASURING TESTING
Information Patent Grant
Near infrared analyzer
- Patent number 5,422,483
- Issue date Jun 6, 1995
- Shimadzu Corporation
- Osamu Ando
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS DEVICE, ANALYSIS METHOD, TRACE LIQUID COLLECTION DEVICE, A...
- Publication number 20210349022
- Publication date Nov 11, 2021
- Shimadzu Corporation
- Yasuo TSUKUDA
- G01 - MEASURING TESTING
Information Patent Application
POLISHING STATE MONITORING APPARATUS AND POLISHING APPARATUS AND ME...
- Publication number 20100075576
- Publication date Mar 25, 2010
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Application
SPECTROPHOTOMETER
- Publication number 20100045980
- Publication date Feb 25, 2010
- SHIMADZU CORPORATION
- Yasuo Tsukuda
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE POLISHING APPARATUS
- Publication number 20090191790
- Publication date Jul 30, 2009
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Application
OPTICAL MEASUREMENT DEVICE FOR TRACE LIQUID SAMPLE
- Publication number 20090073435
- Publication date Mar 19, 2009
- SHIMADZU CORPORATION
- Yasuo Tsukuda
- G01 - MEASURING TESTING
Information Patent Application
Polishing state monitoring apparatus and polishing apparatus and me...
- Publication number 20090011680
- Publication date Jan 8, 2009
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Application
Polishing state monitoring apparatus and polishing apparatus and me...
- Publication number 20070254557
- Publication date Nov 1, 2007
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Application
Substrate polishing apparatus
- Publication number 20070254565
- Publication date Nov 1, 2007
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Application
Substrate polishing apparatus
- Publication number 20070042679
- Publication date Feb 22, 2007
- Kazuto Hirokawa
- B24 - GRINDING POLISHING
Information Patent Application
Spectrophotometric method and apparatus
- Publication number 20060263872
- Publication date Nov 23, 2006
- SHIMADZU CORPORATION
- Yasuo Tsukuda
- G01 - MEASURING TESTING
Information Patent Application
Polishing state monitoring apparatus and polishing apparatus and me...
- Publication number 20060166606
- Publication date Jul 27, 2006
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Application
Substrate polishing apparatus
- Publication number 20050239372
- Publication date Oct 27, 2005
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Application
Substrate polishing apparatus
- Publication number 20040235393
- Publication date Nov 25, 2004
- Kazuto Hirokawa
- B24 - GRINDING POLISHING
Information Patent Application
Substrate polishing apparatus
- Publication number 20040219865
- Publication date Nov 4, 2004
- Yoichi Kobayashi
- B24 - GRINDING POLISHING
Information Patent Application
Substrate polishing apparatus
- Publication number 20030124957
- Publication date Jul 3, 2003
- Yoichi Kobayashi
- B24 - GRINDING POLISHING

Yasuo Tsukuda

Person

Patents Grantslast 30 patents

Analysis device, analysis method, trace liquid collection device, a...

Polishing state monitoring method

Spectrophotometer

Optical measurement device for trace liquid sample

Polishing state monitoring apparatus and polishing apparatus

Substrate polishing apparatus

Spectrophotometric method and apparatus

Substrate polishing apparatus

Substrate polishing apparatus

Polishing state monitoring method

Polishing state monitoring apparatus and polishing apparatus and me...

Substrate polishing apparatus

Substrate polishing apparatus

Substrate polishing apparatus

Substrate polishing apparatus

Infrared light source

Near infrared analyzer

Patents Applicationslast 30 patents

ANALYSIS DEVICE, ANALYSIS METHOD, TRACE LIQUID COLLECTION DEVICE, A...

POLISHING STATE MONITORING APPARATUS AND POLISHING APPARATUS AND ME...

SPECTROPHOTOMETER

SUBSTRATE POLISHING APPARATUS

OPTICAL MEASUREMENT DEVICE FOR TRACE LIQUID SAMPLE

Polishing state monitoring apparatus and polishing apparatus and me...

Polishing state monitoring apparatus and polishing apparatus and me...

Substrate polishing apparatus

Substrate polishing apparatus

Spectrophotometric method and apparatus

Polishing state monitoring apparatus and polishing apparatus and me...

Substrate polishing apparatus

Substrate polishing apparatus

Substrate polishing apparatus

Substrate polishing apparatus