Yasuo WAKABAYASHI

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Wako-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Nondestructive inspection method and apparatus comprising a neutron...
- Patent number 11,841,335
- Issue date Dec 12, 2023
- Riken
- Yasuo Wakabayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Non-Destructive Inspection Device
- Publication number 20240295511
- Publication date Sep 5, 2024
- Riken
- Yasuo WAKABAYASHI
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...
- Publication number 20240272102
- Publication date Aug 15, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTION SYSTEM
- Publication number 20240192153
- Publication date Jun 13, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING DEVICE
- Publication number 20240183801
- Publication date Jun 6, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
CONCENTRATION DETECTION DEVICE AND CONCENTRATION DETECTION METHOD
- Publication number 20230152250
- Publication date May 18, 2023
- Riken
- Yasuo WAKABAYASHI
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTION METHOD AND APPARATUS
- Publication number 20210033542
- Publication date Feb 4, 2021
- Riken
- Yasuo WAKABAYASHI
- G01 - MEASURING TESTING