Yasuro Yoshimitsu

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe card in which contact pressure and relative position of each...
- Patent number 5,134,365
- Issue date Jul 28, 1992
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumasa Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card in which contact pressure and relative position of each...
- Patent number 5,055,778
- Issue date Oct 8, 1991
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumasa Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Complex probe card for testing a semiconductor wafer
- Patent number 4,567,433
- Issue date Jan 28, 1986
- Nihon Denshi Zairo Kabushiki Kaisha
- Masao Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Complex probe card for testing a semiconductor wafer
- Patent number 4,523,144
- Issue date Jun 11, 1985
- Japan Electronic Materials Corp.
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus of semiconductor wafers
- Patent number 4,518,914
- Issue date May 21, 1985
- Japan Electronic Materials Corportion
- Masao Okubo
- G01 - MEASURING TESTING