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Yasushi Matsuda
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and process for producing the same
Patent number
7,402,473
Issue date
Jul 22, 2008
Renesas Technology Corp.
Norio Ishitsuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and process for producing the same
Patent number
6,881,646
Issue date
Apr 19, 2005
Renesas Technology Corp.
Norio Ishitsuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and process for producing the sme
Patent number
6,559,027
Issue date
May 6, 2003
Hitachi, Ltd.
Norio Ishitsuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and process for producing the same
Patent number
6,242,323
Issue date
Jun 5, 2001
Hitachi, Ltd.
Norio Ishitsuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Defect assessing apparatus and method, and semiconductor manufactur...
Patent number
6,226,079
Issue date
May 1, 2001
Hitachi, Ltd.
Kazuo Takeda
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing a semiconductor integrated circuit device
Patent number
6,057,241
Issue date
May 2, 2000
Hitachi, Ltd.
Yasushi Matsuda
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Semiconductor device and process for producing the same
Publication number
20050196935
Publication date
Sep 8, 2005
Norio Ishitsuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and process for producing the same
Publication number
20030181020
Publication date
Sep 25, 2003
Norio Ishitsuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and process for producing the same
Publication number
20030119276
Publication date
Jun 26, 2003
Norio Ishitsuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and process for producing the sme
Publication number
20010026996
Publication date
Oct 4, 2001
Norio Ishitsuka
H01 - BASIC ELECTRIC ELEMENTS