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Yasushi Minomoto
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Ibaraki, JP
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last 30 patents
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Patent Grant
Scanning type probe microscope and probe moving control method ther...
Patent number
7,350,404
Issue date
Apr 1, 2008
Hitachi Kenki Fine Tech Co., Ltd.
Tooru Kurenuma
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Scanning type probe microscope and probe moving control method ther...
Publication number
20060284083
Publication date
Dec 21, 2006
Tooru Kurenuma
G01 - MEASURING TESTING