Yasushi Mizusawa

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Annaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Evaluation method of silicon epitaxial wafer
- Patent number 11,205,599
- Issue date Dec 21, 2021
- Shin-Etsu Handotai Co., Ltd.
- Yasushi Mizusawa
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method for manufacturing silicon epitaxial wafer and method for man...
- Patent number 10,734,220
- Issue date Aug 4, 2020
- Shin-Etsu Handotai Co., Ltd.
- Yasushi Mizusawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method and evaluation method of silicon epitaxial wafer
- Patent number 10,643,908
- Issue date May 5, 2020
- Shin-Etsu Handotai Co., Ltd.
- Yasushi Mizusawa
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method for calculating warpage of bonded SOI wafer and method for m...
- Patent number 8,962,352
- Issue date Feb 24, 2015
- Shin-Etsu Handotai Co., Ltd.
- Isao Yokokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming oxide film on silicon wafer
- Patent number 8,043,871
- Issue date Oct 25, 2011
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
EVALUATION METHOD OF SILICON EPITAXIAL WAFER
- Publication number 20200161197
- Publication date May 21, 2020
- Shin-Etsu Handotai Co., Ltd.
- Yasushi MIZUSAWA
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHOD FOR MANUFACTURING SILICON EPITAXIAL WAFER AND METHOD FOR MAN...
- Publication number 20190228962
- Publication date Jul 25, 2019
- Shin-Etsu Handotai Co., Ltd.
- Yasushi MIZUSAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD AND EVALUATION METHOD OF SILICON EPITAXIAL WAFER
- Publication number 20180277450
- Publication date Sep 27, 2018
- Shin-Etsu Handotai Co., Ltd.
- Yasushi MIZUSAWA
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR CALCULATING WARPAGE OF BONDED SOI WAFER AND METHOD FOR M...
- Publication number 20140186977
- Publication date Jul 3, 2014
- Shin-Etsu Handotai Co., Ltd.
- Isao Yokokawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FORMING OXIDE FILM ON SILICON WAFER
- Publication number 20110033958
- Publication date Feb 10, 2011
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS