Yasushi NISHIOKA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Magneto-resistive effect element
- Patent number 11,209,504
- Issue date Dec 28, 2021
- TDK Corporation
- Kenzo Makino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magneto-resistive effect element
- Patent number 10,718,828
- Issue date Jul 21, 2020
- TDK Corporation
- Kenzo Makino
- G01 - MEASURING TESTING
Information Patent Grant
Thin film magnetic head including soft layer magnetically connected...
- Patent number 8,462,467
- Issue date Jun 11, 2013
- TDK Corporation
- Takumi Yanagisawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Thin film magnetic head including spin-valve film with free layer m...
- Patent number 8,437,106
- Issue date May 7, 2013
- TDK Corporation
- Takumi Yanagisawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thin film magnetic head having temperature detection mechanism, hea...
- Patent number 8,351,157
- Issue date Jan 8, 2013
- TDK Corporation
- Yasushi Nishioka
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MAGNETO-RESISTIVE EFFECT ELEMENT
- Publication number 20200300942
- Publication date Sep 24, 2020
- TDK Corporation
- Kenzo MAKINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETO-RESISTIVE EFFECT ELEMENT
- Publication number 20180292472
- Publication date Oct 11, 2018
- TDK Corporation
- Kenzo MAKINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THIN FILM MAGNETIC HEAD INCLUDING SPIN-VALVE FILM WITH FREE LAYER M...
- Publication number 20120087045
- Publication date Apr 12, 2012
- TDK Corporation
- Takumi Yanagisawa
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM MAGNETIC HEAD INCLUDING SOFT LAYER MAGNETICALLY CONNECTED...
- Publication number 20120087046
- Publication date Apr 12, 2012
- TDK Corporation
- Takumi Yanagisawa
- G01 - MEASURING TESTING
Information Patent Application
Thin film magnetic head, head gimbals assembly, head arm assembly a...
- Publication number 20120008230
- Publication date Jan 12, 2012
- TDK Corporation
- Yasushi NISHIOKA
- G01 - MEASURING TESTING