Yasushi Okawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Computing the characteristics of a field-effect-transistor (FET)
- Patent number 7,535,246
- Issue date May 19, 2009
- Agilent Technologies, Inc.
- Yasushi Okawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring FET characteristics
- Patent number 7,429,869
- Issue date Sep 30, 2008
- Agilent Technologies, Inc.
- Yasushi Okawa
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus for FET characteristics
- Patent number 7,403,031
- Issue date Jul 22, 2008
- Agilent Technologies, Inc.
- Yasushi Okawa
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring FET characteristics
- Patent number 7,242,200
- Issue date Jul 10, 2007
- Agilent Technologies, Inc.
- Yasushi Okawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measurement apparatus for FET characteristics
- Publication number 20070279081
- Publication date Dec 6, 2007
- Yasushi Okawa
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring FET characteristics
- Publication number 20070182439
- Publication date Aug 9, 2007
- AGILENT TECHNOLOGIES, INC.
- Yasushi Okawa
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring FET characteristics
- Publication number 20070013407
- Publication date Jan 18, 2007
- AGILENT TECHNOLOGIES, INC.
- Yasushi Okawa
- G01 - MEASURING TESTING
Information Patent Application
Measurement method for compensation and verification
- Publication number 20060279298
- Publication date Dec 14, 2006
- AGILENT TECHNOLOGIES, INC.
- Eiji Tsuchida
- G01 - MEASURING TESTING
Information Patent Application
System for measuring FET characteristics
- Publication number 20060273807
- Publication date Dec 7, 2006
- AGILENT TECHNOLOGIES, INC.
- Yasushi Okawa
- G01 - MEASURING TESTING
Information Patent Application
Compensation board for measurement using prober, program and record...
- Publication number 20060226860
- Publication date Oct 12, 2006
- AGILENT TECHNOLOGIES, INC.
- Yasushi Okawa
- G01 - MEASURING TESTING