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Yasushi Otsuka
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Kanagawa, JP
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor device and method of inspecting the same
Patent number
6,818,986
Issue date
Nov 16, 2004
Sony Corporation
Yuichiro Ikenaga
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and method for manufacturing the same
Patent number
6,093,970
Issue date
Jul 25, 2000
Sony Corporation
Kenji Ohsawa
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Semiconductor chip housing having a reinforcing plate
Patent number
5,945,741
Issue date
Aug 31, 1999
Sony Corporation
Kenji Ohsawa
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR PACKAGE, ELECTRONIC APPARATUS, AND METHOD FOR MANUFAC...
Publication number
20220208718
Publication date
Jun 30, 2022
Sony Semiconductor Solutions Corporation
YASUSHI OTSUKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and method of inspecting the same
Publication number
20020063250
Publication date
May 30, 2002
Yuichiro Ikenaga
G01 - MEASURING TESTING