Yasushi Saito

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electromagnetic relay
- Patent number 9,653,236
- Issue date May 16, 2017
- Fujitsu Component Limited
- Nobuyoshi Hiraiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromagnetic relay
- Patent number 9,293,286
- Issue date Mar 22, 2016
- Fujitsu Component Limited
- Yasushi Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromagnetic relay
- Patent number 9,007,155
- Issue date Apr 14, 2015
- Fujitsu Component Limited
- Yasushi Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromagnetic relay
- Patent number 9,007,156
- Issue date Apr 14, 2015
- Fujitsu Component Limited
- Nobuyoshi Hiraiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray microscopic inspection apparatus
- Patent number 7,221,731
- Issue date May 22, 2007
- Tohken Co., Ltd.
- Keiji Yada
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray microscopic inspection apparatus
- Patent number 7,218,703
- Issue date May 15, 2007
- Tohken Co., Ltd.
- Keiji Yada
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROMAGNETIC RELAY
- Publication number 20150187526
- Publication date Jul 2, 2015
- FUJITSU COMPONENT LIMITED
- Yasushi SAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROMAGNETIC RELAY
- Publication number 20140159837
- Publication date Jun 12, 2014
- FUJITSU COMPONENT LIMITED
- Nobuyoshi Hiraiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROMAGNETIC RELAY
- Publication number 20140151337
- Publication date Jun 5, 2014
- FUJITSU COMPONENT LIMITED
- Nobuyoshi Hiraiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROMAGNETIC RELAY
- Publication number 20140062626
- Publication date Mar 6, 2014
- FUJITSU COMPONENT LIMITED
- Yasushi SAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray microscopic inspection apparatus
- Publication number 20050111624
- Publication date May 26, 2005
- Keiji Yada
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray microscopic inspection apparatus
- Publication number 20040208280
- Publication date Oct 21, 2004
- Keiji Yada
- G01 - MEASURING TESTING
Information Patent Application
Laser diode module, laser diode device and optical transmitter inco...
- Publication number 20030227694
- Publication date Dec 11, 2003
- Hitachi Kokusai Electric Inc.
- Toshihiro Hosoya
- H01 - BASIC ELECTRIC ELEMENTS