Yasushi Sanada

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection apparatus
- Patent number 7,551,767
- Issue date Jun 23, 2009
- Kabushiki Kaisha Toshiba
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,421,109
- Issue date Sep 2, 2008
- Kabushiki Kaisha Toshiba
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,415,149
- Issue date Aug 19, 2008
- Kabushiki Kaisha Toshiba
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspecting method and pattern inspecting apparatus
- Patent number 7,359,043
- Issue date Apr 15, 2008
- Kabushiki Kaisha Toshiba
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,068,364
- Issue date Jun 27, 2006
- Kabushiki Kaisha Toshiba
- Shinji Sugihara
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 6,909,501
- Issue date Jun 21, 2005
- Kabushiki Kaisha Toshiba
- Riki Ogawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical substrate inspection apparatus
- Patent number 6,084,716
- Issue date Jul 4, 2000
- Kabushiki Kaisha Toshiba
- Yasushi Sanada
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION APPARATUS
- Publication number 20080166054
- Publication date Jul 10, 2008
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS
- Publication number 20070127806
- Publication date Jun 7, 2007
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspecting method and pattern inspecting apparatus
- Publication number 20040184652
- Publication date Sep 23, 2004
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection apparatus
- Publication number 20040105578
- Publication date Jun 3, 2004
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection apparatus
- Publication number 20040070753
- Publication date Apr 15, 2004
- Shinji Sugihara
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspection apparatus and pattern inspection method
- Publication number 20020037099
- Publication date Mar 28, 2002
- Riki Ogawa
- G06 - COMPUTING CALCULATING COUNTING