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Yasushi Sasaki
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Nishinomiya-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
X-ray inspecting apparatus and X-ray inspecting method
Patent number
8,391,581
Issue date
Mar 5, 2013
Omron Corporation
Masayuki Masuda
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
X-RAY INSPECTING APPARATUS AND X-RAY INSPECTING METHOD
Publication number
20100329532
Publication date
Dec 30, 2010
OMRON CORPORATION
Masayuki Masuda
G01 - MEASURING TESTING