Yasushi Terui

Person

Tsuchiura-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer and nozzle member
- Patent number 11,049,706
- Issue date Jun 29, 2021
- HITACHI HIGH-TECH CORPORATION
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and nozzle member
- Patent number 11,011,361
- Issue date May 18, 2021
- HITACHI HIGH-TECH CORPORATION
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 10,607,825
- Issue date Mar 31, 2020
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry device and ion detection method therefor
- Patent number 10,453,663
- Issue date Oct 22, 2019
- Hitachi High-Technologies Corporation
- Shinichi Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with ion frequency selection
- Patent number 10,332,736
- Issue date Jun 25, 2019
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry device
- Patent number 10,229,821
- Issue date Mar 12, 2019
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 10,068,756
- Issue date Sep 4, 2018
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid chromatography-mass spectrometry device
- Patent number 9,921,195
- Issue date Mar 20, 2018
- Hitachi High-Technologies Corporation
- Mitsuhiro Umeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 9,523,663
- Issue date Dec 20, 2016
- Hitachi High-Technologies Corporation
- Yasushi Terui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for mass spectrometry
- Patent number 9,418,825
- Issue date Aug 16, 2016
- Hitachi High-Technologies Corporation
- Hiroyuki Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Light quantity detection method and device therefor
- Patent number 8,797,522
- Issue date Aug 5, 2014
- Hitachi High-Technologies Corporation
- Akihiro Namba
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing device, mass spectrometer, and photometer
- Patent number 8,633,841
- Issue date Jan 21, 2014
- Hitachi High-Technologies Corporation
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric analyzer
- Patent number 8,129,674
- Issue date Mar 6, 2012
- Hitachi High-Technologies Corporation
- Izumi Ogata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 7,999,222
- Issue date Aug 16, 2011
- Hitachi High-Technologies Corporation
- Tsukasa Shishika
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer system
- Patent number 7,932,486
- Issue date Apr 26, 2011
- Hitachi High-Technologies Corporation
- Akihiro Sano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for mass spectrometry
- Patent number 7,928,365
- Issue date Apr 19, 2011
- Hitachi High-Technologies Corporation
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition system
- Patent number 7,890,074
- Issue date Feb 15, 2011
- Hitachi High-Technologies Corporation
- Kenichi Shinbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap time-of-flight mass spectrometer
- Patent number 7,755,035
- Issue date Jul 13, 2010
- Hitachi High-Technologies Corporation
- Hiroshi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric method, mass spectrometric system, diagnosis sys...
- Patent number 7,595,484
- Issue date Sep 29, 2009
- Hitachi High-Technologies Corp.
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tandem type mass analysis system and method
- Patent number 7,544,930
- Issue date Jun 9, 2009
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and its apparatus for mass spectrometry
- Patent number 7,476,850
- Issue date Jan 13, 2009
- Hitachi High-Technologies Corporation
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer system
- Patent number 7,473,892
- Issue date Jan 6, 2009
- Hitachi High-Technologies Corporation
- Akihiro Sano
- G01 - MEASURING TESTING
Information Patent Grant
Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...
- Patent number 7,186,973
- Issue date Mar 6, 2007
- Hitachi High-Technologies Corporation
- Yasushi Terui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry system
- Patent number 7,126,113
- Issue date Oct 24, 2006
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,064,319
- Issue date Jun 20, 2006
- Hitachi High-Technologies Corporation
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer
- Patent number D522391
- Issue date Jun 6, 2006
- Hitachi High-Technologies Corporation
- Mitsuru Onuma
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Mass spectrometry and mass spetrometer using the same
- Patent number 6,765,200
- Issue date Jul 20, 2004
- Hitachi, Ltd.
- Akira Maekawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma ion source mass spectrometer
- Patent number 6,586,730
- Issue date Jul 1, 2003
- Hitachi, Ltd.
- Seiji Kamimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 6,541,769
- Issue date Apr 1, 2003
- Hitachi, Ltd.
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETRY DEVICE AND RF TUNING METHOD OF MASS SPECTROMETRY...
- Publication number 20250104987
- Publication date Mar 27, 2025
- HITACHI HIGH-TECH CORPORATION
- Hikaru Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE LIQUID ATOMIZATION DEVICE AND ANALYSIS DEVICE
- Publication number 20240272126
- Publication date Aug 15, 2024
- Hitachi High-Tech Corporation
- Tooru MIYASAKA
- G01 - MEASURING TESTING
Information Patent Application
ION SOURCE AND MASS SPECTROMETER INCLUDING THE SAME
- Publication number 20230420238
- Publication date Dec 28, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasushi TERUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer and Nozzle Member
- Publication number 20210159063
- Publication date May 27, 2021
- Hitachi High-Technologies Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY DEVICE AND ION DETECTION METHOD THEREFOR
- Publication number 20190027350
- Publication date Jan 24, 2019
- Hitachi High-Technologies Corporation
- Shinichi MURAKAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20190006164
- Publication date Jan 3, 2019
- Hitachi High-Technologies Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry Device
- Publication number 20180269049
- Publication date Sep 20, 2018
- Hitachi High-Technologies Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20170125230
- Publication date May 4, 2017
- Hitachi High-Technologies Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid Chromatography-Mass Spectrometry Device
- Publication number 20160327527
- Publication date Nov 10, 2016
- HITACHI HICH-TECHNOLOGIES CORPORATION
- Mitsuhiro UMEDA
- G01 - MEASURING TESTING
Information Patent Application
Mass Spectrometer
- Publication number 20160169845
- Publication date Jun 16, 2016
- HITACHI HIGH-TECHNOLOGIES CORPORTION
- Yasushi TERUI
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER SYSTEM AND METHOD
- Publication number 20160020082
- Publication date Jan 21, 2016
- Hitachi High-Technologies Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR MASS SPECTROMETRY
- Publication number 20150371837
- Publication date Dec 24, 2015
- Hitachi High-Technologies Corporation
- Hiroyuki YASUDA
- G01 - MEASURING TESTING
Information Patent Application
Light Quantity Detection Method and Device Therefor
- Publication number 20130114073
- Publication date May 9, 2013
- Hitachi High-Technologies Corporation
- Akihiro Namba
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING DEVICE, MASS SPECTROMETER, AND PHOTOMETER
- Publication number 20120154190
- Publication date Jun 21, 2012
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MASS SPECTROMETRY
- Publication number 20110192970
- Publication date Aug 11, 2011
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-Of-Flight Mass Spectrometer
- Publication number 20090294659
- Publication date Dec 3, 2009
- Tsukasa SHISHIKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER SYSTEM
- Publication number 20090189063
- Publication date Jul 30, 2009
- Akihiro Sano
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20090179148
- Publication date Jul 16, 2009
- Hitachi High-Technologies Corporation
- Hiroyuki Yasuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometric analyzer
- Publication number 20080315082
- Publication date Dec 25, 2008
- Hitachi High-Technologies Corporation
- Izumi Ogata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap time-of-flight mass spectrometer
- Publication number 20080245962
- Publication date Oct 9, 2008
- Hitachi High-Technologies Corporation
- Hiroshi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA ACQUISITION SYSTEM
- Publication number 20080073504
- Publication date Mar 27, 2008
- Kenichi Shinbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TANDEM TYPE MASS ANALYSIS SYSTEM AND METHOD
- Publication number 20070187588
- Publication date Aug 16, 2007
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and its apparatus for mass spectrometry
- Publication number 20060289739
- Publication date Dec 28, 2006
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for mass spectrometry
- Publication number 20060248942
- Publication date Nov 9, 2006
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometric method, mass spectrometric system, diagnosis sys...
- Publication number 20060169889
- Publication date Aug 3, 2006
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...
- Publication number 20050279926
- Publication date Dec 22, 2005
- Yasushi Terui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometry system
- Publication number 20050184232
- Publication date Aug 25, 2005
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer system
- Publication number 20050063864
- Publication date Mar 24, 2005
- Akihiro Sano
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometer
- Publication number 20040195502
- Publication date Oct 7, 2004
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometry and mass spetrometer using the same
- Publication number 20010019107
- Publication date Sep 6, 2001
- Hitachi, Ltd.
- Akira Maekawa
- H01 - BASIC ELECTRIC ELEMENTS

Yasushi Terui

Person

Patents Grantslast 30 patents

Mass spectrometer and nozzle member

Mass spectrometer and nozzle member

Mass spectrometer

Mass spectrometry device and ion detection method therefor

Mass spectrometer with ion frequency selection

Mass spectrometry device

Mass spectrometer

Liquid chromatography-mass spectrometry device

Mass spectrometer

Method and device for mass spectrometry

Light quantity detection method and device therefor

Signal processing device, mass spectrometer, and photometer

Mass spectrometric analyzer

Time-of-flight mass spectrometer

Mass spectrometer system

Method and apparatus for mass spectrometry

Data acquisition system

Ion trap time-of-flight mass spectrometer

Mass spectrometric method, mass spectrometric system, diagnosis sys...

Tandem type mass analysis system and method

Method and its apparatus for mass spectrometry

Mass spectrometer system

Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...

Mass spectrometry system

Mass spectrometer

Time of flight mass spectrometer

Mass spectrometry and mass spetrometer using the same

Plasma ion source mass spectrometer

Mass spectrometer

Patents Applicationslast 30 patents

MASS SPECTROMETRY DEVICE AND RF TUNING METHOD OF MASS SPECTROMETRY...

SAMPLE LIQUID ATOMIZATION DEVICE AND ANALYSIS DEVICE

ION SOURCE AND MASS SPECTROMETER INCLUDING THE SAME

Mass Spectrometer and Nozzle Member

MASS SPECTROMETRY DEVICE AND ION DETECTION METHOD THEREFOR

Mass Spectrometer

Mass Spectrometry Device

MASS SPECTROMETER

Liquid Chromatography-Mass Spectrometry Device

Mass Spectrometer

MASS SPECTROMETER SYSTEM AND METHOD

METHOD AND DEVICE FOR MASS SPECTROMETRY

Light Quantity Detection Method and Device Therefor

SIGNAL PROCESSING DEVICE, MASS SPECTROMETER, AND PHOTOMETER

METHOD AND APPARATUS FOR MASS SPECTROMETRY

Time-Of-Flight Mass Spectrometer

MASS SPECTROMETER SYSTEM

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

Mass spectrometric analyzer

Ion trap time-of-flight mass spectrometer

DATA ACQUISITION SYSTEM

TANDEM TYPE MASS ANALYSIS SYSTEM AND METHOD

Method and its apparatus for mass spectrometry

Method and apparatus for mass spectrometry

Mass spectrometric method, mass spectrometric system, diagnosis sys...

Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...

Mass spectrometry system

Mass spectrometer system

Mass spectrometer

Mass spectrometry and mass spetrometer using the same