Yasushi Ueshima

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Tsukuba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Shape measurement method and shape measurement apparatus
- Patent number 7,595,893
- Issue date Sep 29, 2009
- Mitutoyo Corporation
- Sotomitsu Hara
- G01 - MEASURING TESTING
Information Patent Grant
Optical-axis deflection type laser interferometer, calibration meth...
- Patent number 7,408,650
- Issue date Aug 5, 2008
- Mitutoyo Corporation
- Yasushi Ueshima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Shape measurement method and shape measurement apparatus
- Publication number 20080068608
- Publication date Mar 20, 2008
- Mitutoyo Corporation
- Sotomitsu Hara
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL-AXIS DEFLECTION TYPE LASER INTERFEROMETER, CALIBRATION METH...
- Publication number 20080049211
- Publication date Feb 28, 2008
- Mitutoyo Corporation
- Yasushi Ueshima
- G01 - MEASURING TESTING