Yasushi Zaitsu

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting flocculation process of componen...
- Patent number 5,194,921
- Issue date Mar 16, 1993
- Fuji Electric Co., Ltd.
- Norihito Tambo
- G01 - MEASURING TESTING
Information Patent Grant
Particle detecting device with particle scanning
- Patent number 4,827,144
- Issue date May 2, 1989
- Fuji Electric Co., Ltd.
- Yasushi Zaitsu
- G01 - MEASURING TESTING