Yasutada Miura

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Hachioji-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Image data file management system and method
- Patent number 7,289,660
- Issue date Oct 30, 2007
- Olympus Optical Co., Ltd.
- Yasutada Miura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for aligning target object
- Patent number 6,549,290
- Issue date Apr 15, 2003
- Olympus Optical Co., Ltd.
- Yasutada Miura
- G01 - MEASURING TESTING
Information Patent Grant
Defect detecting apparatus
- Patent number 6,501,545
- Issue date Dec 31, 2002
- Olympus Optical Co., Ltd.
- Takahiro Komuro
- G01 - MEASURING TESTING
Information Patent Grant
Confocal microscope
- Patent number 6,341,035
- Issue date Jan 22, 2002
- Olympus Optical Co., Ltd.
- Yasutada Miura
- G02 - OPTICS
Information Patent Grant
Position detecting apparatus for semiconductor wafer
- Patent number 6,201,603
- Issue date Mar 13, 2001
- Olympus Optical Co., Ltd.
- Yasutada Miura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Image data file management system and method
- Publication number 20030002580
- Publication date Jan 2, 2003
- Olympus Optical Co., Ltd.
- Yasutada Miura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect detecting apparatus
- Publication number 20020031249
- Publication date Mar 14, 2002
- Olympus Optical Co., Ltd.
- Takahiro Komuro
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for aligning target object
- Publication number 20010006571
- Publication date Jul 5, 2001
- Olympus Optical Co., Ltd.
- Yasutada Miura
- G01 - MEASURING TESTING