Yasutaka Arakawa

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe device, processing device, and probe testing method
- Patent number 8,283,940
- Issue date Oct 9, 2012
- Kabushiki Kaisha Toshiba
- Yasutaka Arakawa
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection system, defect detection method, and defect detect...
- Patent number 7,529,631
- Issue date May 5, 2009
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE DEVICE, PROCESSING DEVICE, AND PROBE TESTING METHOD
- Publication number 20100148810
- Publication date Jun 17, 2010
- Yasutaka ARAKAWA
- G01 - MEASURING TESTING
Information Patent Application
Defect detection system, defect detection method, and defect detect...
- Publication number 20080004823
- Publication date Jan 3, 2008
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING