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Yasutaka SAKUMA
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Tokyo, JP
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last 30 patents
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Patent Grant
Processing apparatus, sysyem, X-ray measurement method, and program
Patent number
11,221,423
Issue date
Jan 11, 2022
Rigaku Corporation
Shintaro Kobayashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
RADIATION DETECTOR, RADIATION MEASURING APPARATUS, AND METHOD FOR S...
Publication number
20240280714
Publication date
Aug 22, 2024
Rigaku Corporation
Kunitoshi YANAGIHARA
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR, TRIGGER SIGNAL GENERATOR, AND RADIATION ANALYZI...
Publication number
20240280711
Publication date
Aug 22, 2024
Rigaku Corporation
Yasutaka SAKUMA
G01 - MEASURING TESTING
Information
Patent Application
PROCESSING APPARATUS, SYSYEM, X-RAY MEASUREMENT METHOD, AND PROGRAM
Publication number
20210124066
Publication date
Apr 29, 2021
Rigaku Corporation
Shintaro KOBAYASHI
G01 - MEASURING TESTING