Yasutaka TOYODA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image evaluation apparatus and image evaluation method
- Patent number 12,100,133
- Issue date Sep 24, 2024
- HITACHI HIGH-TECH CORPORATION
- Shuyang Dou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image recognition device and method
- Patent number 12,014,530
- Issue date Jun 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Ryou Yumiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing system and computer program for performing image p...
- Patent number 11,836,906
- Issue date Dec 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dimension measurement apparatus, dimension measurement program, and...
- Patent number 11,600,536
- Issue date Mar 7, 2023
- HITACHI HIGH-TECH CORPORATION
- Yutaka Okuyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection system
- Patent number 11,587,225
- Issue date Feb 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Shuyang Dou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing system and computer program for performing image p...
- Patent number 11,176,405
- Issue date Nov 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection system
- Patent number 11,132,788
- Issue date Sep 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Shuyang Dou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Money handling machine and money handling system
- Patent number 11,049,351
- Issue date Jun 29, 2021
- Glory Ltd.
- Yasutaka Toyoda
- G07 - CHECKING-DEVICES
Information Patent Grant
Image evaluation method and image evaluation device
- Patent number 10,937,146
- Issue date Mar 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor measurement apparatus and computer program
- Patent number 10,643,326
- Issue date May 5, 2020
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Exposure condition evaluation device
- Patent number 10,558,127
- Issue date Feb 11, 2020
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern-measuring apparatus and semiconductor-measuring system
- Patent number 10,445,875
- Issue date Oct 15, 2019
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dimension measuring apparatus and computer readable medium
- Patent number 10,317,203
- Issue date Jun 11, 2019
- Hitachi High-Technologies Corporation
- Tsuyoshi Minakawa
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measurement condition setting device and pattern measuring...
- Patent number 10,190,875
- Issue date Jan 29, 2019
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern-measuring device and computer program
- Patent number 10,180,317
- Issue date Jan 15, 2019
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern-measuring apparatus and semiconductor-measuring system
- Patent number 9,990,708
- Issue date Jun 5, 2018
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspecting and measuring device and program
- Patent number 9,858,659
- Issue date Jan 2, 2018
- Hitachi High-Technologies Corporation
- Tsuyoshi Minakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern sensing device and semiconductor sensing system
- Patent number 9,846,931
- Issue date Dec 19, 2017
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image evaluation apparatus and pattern shape evaluation apparatus
- Patent number 9,830,705
- Issue date Nov 28, 2017
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Money handling machine, money handling system and money handling me...
- Patent number 9,495,844
- Issue date Nov 15, 2016
- Glory Ltd.
- Yasutaka Toyoda
- G07 - CHECKING-DEVICES
Information Patent Grant
Money handling machine, money handling system, money handling metho...
- Patent number 9,396,620
- Issue date Jul 19, 2016
- Glory Ltd.
- Atsushi Takayama
- G07 - CHECKING-DEVICES
Information Patent Grant
Image processing apparatus
- Patent number 9,183,622
- Issue date Nov 10, 2015
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern matching method, image processing device, and computer program
- Patent number 9,141,879
- Issue date Sep 22, 2015
- Hitachi High-Technologies Corporation
- Hiroyuki Ushiba
- G01 - MEASURING TESTING
Information Patent Grant
Pattern shape evaluation method and pattern shape evaluation apparatus
- Patent number 8,977,034
- Issue date Mar 10, 2015
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G01 - MEASURING TESTING
Information Patent Grant
Method of creating template for matching, as well as device for cre...
- Patent number 8,867,818
- Issue date Oct 21, 2014
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method, pattern inspection apparatus and pattern...
- Patent number 8,705,841
- Issue date Apr 22, 2014
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus, image processing method, and image proc...
- Patent number 8,687,921
- Issue date Apr 1, 2014
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern generating apparatus and pattern shape evaluating apparatus
- Patent number 8,655,050
- Issue date Feb 18, 2014
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method, pattern inspection program, and electron...
- Patent number 8,653,456
- Issue date Feb 18, 2014
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus of pattern inspection and semiconductor inspec...
- Patent number 8,577,124
- Issue date Nov 5, 2013
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Localization Apparatus and Method
- Publication number 20240177333
- Publication date May 30, 2024
- Hitachi High-Tech Corporation
- Mitsuji IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Training Method for Learning Apparatus, and Image Generation System
- Publication number 20240144560
- Publication date May 2, 2024
- Hitachi High-Tech Corporation
- Zhaohui CHENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE RESTORATION SYSTEM AND IMAGE RESTORATION METHOD
- Publication number 20230298137
- Publication date Sep 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Masayoshi ISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING METHOD, PATTERN INSPECTION METHOD, IMAGE PROCESSIN...
- Publication number 20230222764
- Publication date Jul 13, 2023
- HITACHI HIGH-TECH CORPORATION
- Masanori OUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, APPARATUS, AND PROGRAM FOR DETERMINING CONDITION RELATED TO...
- Publication number 20230032587
- Publication date Feb 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Takahiro NISHIHATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEARNING PROCESSING DEVICE AND LEARNING PROCESSING METHOD
- Publication number 20230004811
- Publication date Jan 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Masayoshi ISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System for Generating Image, and Non-Transitory Computer-Readable M...
- Publication number 20220415024
- Publication date Dec 29, 2022
- Hitachi High-Tech Corporation
- Yasutaka TOYODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE RECOGNITION SYSTEM
- Publication number 20220392187
- Publication date Dec 8, 2022
- HITACHI HIGH-TECH CORPORATION
- Toshinori YAMAUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image Processing Program, Image Processing Device, and Image Proces...
- Publication number 20220318975
- Publication date Oct 6, 2022
- Hitachi High-Tech Corporation
- Masanori OUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIMENSION MEASUREMENT APPARATUS, DIMENSION MEASUREMENT PROGRAM, AND...
- Publication number 20220139788
- Publication date May 5, 2022
- Hitachi High-Tech Corporation
- Yutaka Okuyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure Estimation System and Structure Estimation Program
- Publication number 20220130027
- Publication date Apr 28, 2022
- Hitachi High-Tech Corporation
- Muneyuki FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
Image Evaluation Apparatus and Image Evaluation Method
- Publication number 20220067902
- Publication date Mar 3, 2022
- Hitachi High-Tech Corporation
- Shuyang DOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING SYSTEM AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...
- Publication number 20220036116
- Publication date Feb 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Shinichi SHINODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION SYSTEM
- Publication number 20210383524
- Publication date Dec 9, 2021
- Hitachi High-Technologies Corporation
- Shuyang DOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE RECOGNITION DEVICE AND METHOD
- Publication number 20210374403
- Publication date Dec 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryou YUMIBA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING SYSTEM AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...
- Publication number 20200134355
- Publication date Apr 30, 2020
- Hitachi High-Technologies Corporation
- Shinichi SHINODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION SYSTEM
- Publication number 20200074611
- Publication date Mar 5, 2020
- Hitachi High-Technologies Corporation
- Shuyang DOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Evaluation Apparatus and Computer Program
- Publication number 20200033122
- Publication date Jan 30, 2020
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G01 - MEASURING TESTING
Information Patent Application
Image Evaluation Method and Image Evaluation Device
- Publication number 20190228522
- Publication date Jul 25, 2019
- Hitachi High-Technologies Corporation
- Shinichi SHINODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONEY HANDLING MACHINE AND MONEY HANDLING SYSTEM
- Publication number 20190197812
- Publication date Jun 27, 2019
- GLORY LTD.
- Yasutaka TOYODA
- G07 - CHECKING-DEVICES
Information Patent Application
Pattern-Measuring Apparatus and Semiconductor-Measuring System
- Publication number 20180247400
- Publication date Aug 30, 2018
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Exposure Condition Evaluation Device
- Publication number 20170336717
- Publication date Nov 23, 2017
- Hitachi High-Technologies Corporation
- Shinichi SHINODA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERN MEASUREMENT CONDITION SETTING DEVICE AND PATTERN MEASURING...
- Publication number 20170160082
- Publication date Jun 8, 2017
- Hitachi High-Technologies Corporation
- Shinichi SHINODA
- G01 - MEASURING TESTING
Information Patent Application
Pattern-Measuring Device and Computer Program
- Publication number 20160356598
- Publication date Dec 8, 2016
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G01 - MEASURING TESTING
Information Patent Application
Pattern-Measuring Apparatus and Semiconductor-Measuring System
- Publication number 20160005157
- Publication date Jan 7, 2016
- Hitachi High-Technologies Corporation
- Yasutaka TOYODA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE EVALUATION APPARATUS AND PATTERN SHAPE EVALUATION APPARATUS
- Publication number 20150287201
- Publication date Oct 8, 2015
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Inspecting and Measuring Device and Program
- Publication number 20150228063
- Publication date Aug 13, 2015
- Hitachi High-Technologies Corporation
- Tsuyoshi Minakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONEY HANDLING MACHINE, MONEY HANDLING SYSTEM AND MONEY HANDLING ME...
- Publication number 20150206402
- Publication date Jul 23, 2015
- GLORY LTD.
- Yasutaka Toyoda
- G07 - CHECKING-DEVICES
Information Patent Application
Pattern Sensing Device and Semiconductor Sensing System
- Publication number 20150016709
- Publication date Jan 15, 2015
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Measurement Apparatus and Computer Program
- Publication number 20150009319
- Publication date Jan 8, 2015
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING

Yasutaka TOYODA

Person

Patents Grantslast 30 patents

Image evaluation apparatus and image evaluation method

Image recognition device and method

Image processing system and computer program for performing image p...

Dimension measurement apparatus, dimension measurement program, and...

Pattern inspection system

Image processing system and computer program for performing image p...

Pattern inspection system

Money handling machine and money handling system

Image evaluation method and image evaluation device

Semiconductor measurement apparatus and computer program

Exposure condition evaluation device

Pattern-measuring apparatus and semiconductor-measuring system

Dimension measuring apparatus and computer readable medium

Pattern measurement condition setting device and pattern measuring...

Pattern-measuring device and computer program

Pattern-measuring apparatus and semiconductor-measuring system

Pattern inspecting and measuring device and program

Pattern sensing device and semiconductor sensing system

Image evaluation apparatus and pattern shape evaluation apparatus

Money handling machine, money handling system and money handling me...

Money handling machine, money handling system, money handling metho...

Image processing apparatus

Pattern matching method, image processing device, and computer program

Pattern shape evaluation method and pattern shape evaluation apparatus

Method of creating template for matching, as well as device for cre...

Pattern inspection method, pattern inspection apparatus and pattern...

Image processing apparatus, image processing method, and image proc...

Pattern generating apparatus and pattern shape evaluating apparatus

Pattern inspection method, pattern inspection program, and electron...

Method and apparatus of pattern inspection and semiconductor inspec...

Patents Applicationslast 30 patents

Localization Apparatus and Method

Training Method for Learning Apparatus, and Image Generation System

IMAGE RESTORATION SYSTEM AND IMAGE RESTORATION METHOD

IMAGE PROCESSING METHOD, PATTERN INSPECTION METHOD, IMAGE PROCESSIN...

METHOD, APPARATUS, AND PROGRAM FOR DETERMINING CONDITION RELATED TO...

LEARNING PROCESSING DEVICE AND LEARNING PROCESSING METHOD

System for Generating Image, and Non-Transitory Computer-Readable M...

IMAGE RECOGNITION SYSTEM

Image Processing Program, Image Processing Device, and Image Proces...

DIMENSION MEASUREMENT APPARATUS, DIMENSION MEASUREMENT PROGRAM, AND...

Structure Estimation System and Structure Estimation Program

Image Evaluation Apparatus and Image Evaluation Method

IMAGE PROCESSING SYSTEM AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...

PATTERN INSPECTION SYSTEM

IMAGE RECOGNITION DEVICE AND METHOD

IMAGE PROCESSING SYSTEM AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...

PATTERN INSPECTION SYSTEM

Pattern Evaluation Apparatus and Computer Program

Image Evaluation Method and Image Evaluation Device

MONEY HANDLING MACHINE AND MONEY HANDLING SYSTEM

Pattern-Measuring Apparatus and Semiconductor-Measuring System

Exposure Condition Evaluation Device

PATTERN MEASUREMENT CONDITION SETTING DEVICE AND PATTERN MEASURING...

Pattern-Measuring Device and Computer Program

Pattern-Measuring Apparatus and Semiconductor-Measuring System

IMAGE EVALUATION APPARATUS AND PATTERN SHAPE EVALUATION APPARATUS

Pattern Inspecting and Measuring Device and Program

MONEY HANDLING MACHINE, MONEY HANDLING SYSTEM AND MONEY HANDLING ME...

Pattern Sensing Device and Semiconductor Sensing System

Semiconductor Measurement Apparatus and Computer Program