Yasutaka Tsuruki

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test device
- Patent number 7,461,314
- Issue date Dec 2, 2008
- Advantest Corporation
- Noriaki Chiba
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test device having clock recovery circuit
- Patent number 7,187,192
- Issue date Mar 6, 2007
- Advantest Corp.
- Hideyuki Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Tester for testing an electronic device using oscillator and freque...
- Patent number 6,956,395
- Issue date Oct 18, 2005
- Advantest Corporation
- Hideyuki Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Variable delay circuit and a testing apparatus for a semiconductor...
- Patent number 6,791,389
- Issue date Sep 14, 2004
- Advantest Corporation
- Hiroyuki Mikami
- G01 - MEASURING TESTING
Information Patent Grant
Timing signal generation circuit and semiconductor test device with...
- Patent number 6,768,360
- Issue date Jul 27, 2004
- Advantest Corp.
- Yasutaka Tsuruki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor tester synchronized with external clock
- Patent number 5,886,536
- Issue date Mar 23, 1999
- Advantest Corp.
- Yasutaka Tsuruki
- G01 - MEASURING TESTING
Information Patent Grant
Period generator for semiconductor testing apparatus
- Patent number 5,761,100
- Issue date Jun 2, 1998
- Advantest Corporation
- Masayuki Itoh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test device
- Publication number 20050210341
- Publication date Sep 22, 2005
- Advantest Corporation
- Noriaki Chiba
- G01 - MEASURING TESTING
Information Patent Application
Tester
- Publication number 20040239310
- Publication date Dec 2, 2004
- Hideyuki Oshima
- G01 - MEASURING TESTING
Information Patent Application
Variable delay circuit and a testing apparatus for a semiconductor...
- Publication number 20030128064
- Publication date Jul 10, 2003
- Hiroyuki Mikami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Timing signal generation circuit and semiconductor test device with...
- Publication number 20020027431
- Publication date Mar 7, 2002
- Yasutaka Tsuruki
- G01 - MEASURING TESTING