Yasuteru Maeda

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit and system LSI having a test expec...
- Patent number 7,739,571
- Issue date Jun 15, 2010
- Panasonic Corporation
- Yasuteru Maeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Integrated Circuit and System Lsi
- Publication number 20080141089
- Publication date Jun 12, 2008
- Yasuteru Maeda
- G01 - MEASURING TESTING