Yasutoshi Kitahara

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Ina-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspecting semiconductor wafer
- Patent number 7,308,329
- Issue date Dec 11, 2007
- Olympus Corporation
- Yasunori Ikeno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor wafer inspection apparatus
- Patent number 7,102,743
- Issue date Sep 5, 2006
- Olympus Corporation
- Haruyuki Tsuji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for inspecting semiconductor wafer
- Publication number 20060161284
- Publication date Jul 20, 2006
- OLYMPUS CORPORATION
- Yasunori Ikeno
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor wafer inspection apparatus
- Publication number 20050062960
- Publication date Mar 24, 2005
- Olympus Optical Co., Ltd.
- Haruyuki Tsuji
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wafer inspection apparatus
- Publication number 20030202178
- Publication date Oct 30, 2003
- Olympus Optical Co., Ltd.
- Haruyuki Tsuji
- G01 - MEASURING TESTING