Yasutoshi Okuno

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Substrate processing method and substrate processing apparatus
- Patent number 12,065,746
- Issue date Aug 20, 2024
- SCREEN Holdings Co., Ltd.
- Akihisa Iwasaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for manufacturing a dual work function semiconductor device...
- Patent number 10,424,517
- Issue date Sep 24, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Joshua Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for integrated devices on different substartes...
- Patent number 9,362,123
- Issue date Jun 7, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Liang-Gi Yao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a carbon-free dielectric layer over a carbon-...
- Patent number 8,987,095
- Issue date Mar 24, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kun-Yu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET with metal gate stressor
- Patent number 8,872,284
- Issue date Oct 28, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andrew Joseph Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-layer scavenging metal gate stack for ultra-thin interfacial...
- Patent number 8,766,379
- Issue date Jul 1, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuan-Ting Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of forming the same
- Patent number 8,759,920
- Issue date Jun 24, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Clement Hsingjen Wann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 7,800,181
- Issue date Sep 21, 2010
- Panasonic Corporation
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device and manufacturing method thereof
- Patent number 7,655,483
- Issue date Feb 2, 2010
- Panasonic Corporation
- Yasutoshi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 7,585,767
- Issue date Sep 8, 2009
- Panasonic Corporation
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing method including three gate insu...
- Patent number 7,517,760
- Issue date Apr 14, 2009
- Panasonic Corporation
- Hideyuki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 7,446,015
- Issue date Nov 4, 2008
- Matsushita Electric Industrial Co., Ltd.
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gapfill using deposition-etch sequence
- Patent number 7,329,586
- Issue date Feb 12, 2008
- Applied Materials, Inc.
- Manoj Vellaikal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 7,276,769
- Issue date Oct 2, 2007
- Matsushita Electric Industrial Co., Ltd.
- Masaru Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistance defect assessment device, resistance defect assessment m...
- Patent number 7,253,436
- Issue date Aug 7, 2007
- Matsushita Electric Industrial Co., Ltd.
- Michikazu Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
In-plane distribution data compression method, in-plane distributio...
- Patent number 7,249,343
- Issue date Jul 24, 2007
- Matsushita Electric Industrial Co., Ltd.
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring silicide proportion, method for measuring anne...
- Patent number 7,202,095
- Issue date Apr 10, 2007
- Matsushita Electric Industrial Co., Ltd.
- Akihiko Tsuzumitani
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 7,202,147
- Issue date Apr 10, 2007
- Matsushita Electric Industrial Co., Ltd.
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method for fabricating the same
- Patent number 7,196,346
- Issue date Mar 27, 2007
- Matsushita Electric Industrial Co., Ltd.
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a semiconductor device including a capacitan...
- Patent number 6,884,674
- Issue date Apr 26, 2005
- Matsushita Electric Industrial Co., Ltd.
- Akihiko Tsuzumitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating semiconductor device
- Patent number 6,773,979
- Issue date Aug 10, 2004
- Matsushita Electric Industrial Co., Ltd.
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 6,645,807
- Issue date Nov 11, 2003
- Matsushita Electric Industrial Co., Ltd.
- Akihiko Tsuzumitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 6,531,729
- Issue date Mar 11, 2003
- Matsushita Electric Industrial Co., Ltd.
- Akihiko Tsuzumitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with capacitor using high dielectric constant...
- Patent number 6,501,113
- Issue date Dec 31, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Yoshikazu Tsunemine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a semiconductor device
- Patent number 6,436,786
- Issue date Aug 20, 2002
- Matsushita Electronics Corporation
- Akihiko Tsuzumitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of fabricating the same
- Patent number 6,265,262
- Issue date Jul 24, 2001
- Matsushita Electric Industrial Co., Ltd.
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
- Publication number 20220267909
- Publication date Aug 25, 2022
- SCREEN Holdings Co., Ltd.
- Akihisa IWASAKI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method for Manufacturing A Dual Work Function Semiconductor Device...
- Publication number 20160365289
- Publication date Dec 15, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Joshua Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure And Method For Integrated Devices On Different Substartes...
- Publication number 20140175513
- Publication date Jun 26, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Liang-Gi Yao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method of Forming the Same
- Publication number 20130320452
- Publication date Dec 5, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Clement Hsingjen Wann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FinFET with Metal Gate Stressor
- Publication number 20130249019
- Publication date Sep 26, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andrew Joseph Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-LAYER SCAVENGING METAL GATE STACK FOR ULTRA-THIN INTERFACIAL...
- Publication number 20130075833
- Publication date Mar 28, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuan-Ting Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING HIGH-K GATE DIELECTRIC LAYER AND MANUF...
- Publication number 20130043545
- Publication date Feb 21, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kun-Yu LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING A DUAL WORK FUNCTION SEMICONDUCTOR DEVICE...
- Publication number 20100219481
- Publication date Sep 2, 2010
- IMEC
- Joshua Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20100032733
- Publication date Feb 11, 2010
- PANASONIC CORPORATION
- Satoru ITOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20090011596
- Publication date Jan 8, 2009
- Matsushita Electric Industrial Co., Ltd.
- Yasutoshi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device manufacturing method
- Publication number 20070275529
- Publication date Nov 29, 2007
- Hideyuki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device and method for fabricating the same
- Publication number 20070158635
- Publication date Jul 12, 2007
- Matsushita Electric Industrial Co., Ltd.
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20070158760
- Publication date Jul 12, 2007
- Matsushita Electric Industrial Co., Ltd.
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20070093047
- Publication date Apr 26, 2007
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gapfill using deposition-etch sequence
- Publication number 20060292894
- Publication date Dec 28, 2006
- Applied Materials, Inc.,
- Manoj Vellaikal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Evaluation semiconductor device
- Publication number 20060273371
- Publication date Dec 7, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Yoko Tohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20060189087
- Publication date Aug 24, 2006
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor package, ID generating system thereof, ID recognizing...
- Publication number 20060187719
- Publication date Aug 24, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Michikazu Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20060138562
- Publication date Jun 29, 2006
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electronic device and manufacturing method thereof
- Publication number 20060131575
- Publication date Jun 22, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Yasutoshi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20060087000
- Publication date Apr 27, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20050285217
- Publication date Dec 29, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Resistance defect assessment device, resistance defect assessment m...
- Publication number 20050017746
- Publication date Jan 27, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Michikazu Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
In-plane distribution data compression method, in-plane distributio...
- Publication number 20050015736
- Publication date Jan 20, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL, CO., LTD.
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device and method for fabricating the same
- Publication number 20050006681
- Publication date Jan 13, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Yasutoshi Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20040238900
- Publication date Dec 2, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Masaru Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for measuring silicide proportion, method for measuring anne...
- Publication number 20040137650
- Publication date Jul 15, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Akihiko Tsuzumitani
- G01 - MEASURING TESTING
Information Patent Application
Method for depositing sputtered film
- Publication number 20030230480
- Publication date Dec 18, 2003
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Akihiko Tsuzumitani
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Smiconductor device and method for fabricating the same
- Publication number 20030155596
- Publication date Aug 21, 2003
- Matsushita Electric Industrial Co., Ltd.
- Akihiko Tsuzumitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing semiconductor device
- Publication number 20030045053
- Publication date Mar 6, 2003
- Matsushita Electric Industrial Co., Ltd.
- Akihiko Tsuzumitani
- H01 - BASIC ELECTRIC ELEMENTS

Yasutoshi Okuno

Person

Patents Grantslast 30 patents

Substrate processing method and substrate processing apparatus

Method for manufacturing a dual work function semiconductor device...

Structure and method for integrated devices on different substartes...

Method of fabricating a carbon-free dielectric layer over a carbon-...

FinFET with metal gate stressor

Multi-layer scavenging metal gate stack for ultra-thin interfacial...

Semiconductor device and method of forming the same

Semiconductor device and method for fabricating the same

Electronic device and manufacturing method thereof

Semiconductor device and method for fabricating the same

Semiconductor device manufacturing method including three gate insu...

Semiconductor device and method for manufacturing the same

Gapfill using deposition-etch sequence

Semiconductor integrated circuit device

Resistance defect assessment device, resistance defect assessment m...

In-plane distribution data compression method, in-plane distributio...

Method for measuring silicide proportion, method for measuring anne...

Semiconductor device and method for fabricating the same

Semiconductor memory device and method for fabricating the same

Method for fabricating a semiconductor device including a capacitan...

Method for fabricating semiconductor device

Method for manufacturing semiconductor device

Semiconductor device and method for fabricating the same

Semiconductor device with capacitor using high dielectric constant...

Method for fabricating a semiconductor device

Semiconductor device and method of fabricating the same

Patents Applicationslast 30 patents

SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS

Method for Manufacturing A Dual Work Function Semiconductor Device...

Structure And Method For Integrated Devices On Different Substartes...

Semiconductor Device and Method of Forming the Same

FinFET with Metal Gate Stressor

MULTI-LAYER SCAVENGING METAL GATE STACK FOR ULTRA-THIN INTERFACIAL...

SEMICONDUCTOR DEVICE HAVING HIGH-K GATE DIELECTRIC LAYER AND MANUF...

METHOD FOR MANUFACTURING A DUAL WORK FUNCTION SEMICONDUCTOR DEVICE...

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF

Semiconductor device manufacturing method

Semiconductor memory device and method for fabricating the same

Semiconductor device and method for fabricating the same

Semiconductor device and method for fabricating the same

Gapfill using deposition-etch sequence

Evaluation semiconductor device

Semiconductor device and method for fabricating the same

Semiconductor package, ID generating system thereof, ID recognizing...

Semiconductor device and method for fabricating the same

Electronic device and manufacturing method thereof

Semiconductor device and manufacturing method thereof

Semiconductor device and method for manufacturing the same

Resistance defect assessment device, resistance defect assessment m...

In-plane distribution data compression method, in-plane distributio...

Semiconductor memory device and method for fabricating the same

Semiconductor integrated circuit device

Method for measuring silicide proportion, method for measuring anne...

Method for depositing sputtered film

Smiconductor device and method for fabricating the same

Method for manufacturing semiconductor device