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Yasuyuki Furukawa
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Kyoto-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Optical measurement probe and optical measurement device provided w...
Patent number
10,031,021
Issue date
Jul 24, 2018
Shimadzu Corporation
Ryoji Hiraoka
G01 - MEASURING TESTING
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Patent Grant
Optical measurement probe, and optical measurement device provided...
Patent number
9,239,298
Issue date
Jan 19, 2016
Shimadzu Corporation
Tetsuya Nagai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DIELECTRIC MULTILAYER FILM MIRROR
Publication number
20210041608
Publication date
Feb 11, 2021
Shimadzu Corporation
Takuya KIMOTO
G02 - OPTICS
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Patent Application
OPTICAL MEASUREMENT PROBE AND OPTICAL MEASUREMENT DEVICE PROVIDED W...
Publication number
20160349107
Publication date
Dec 1, 2016
Shimadzu Corporation
Ryoji Hiraoka
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT PROBE, AND OPTICAL MEASUREMENT DEVICE PROVIDED...
Publication number
20150085283
Publication date
Mar 26, 2015
Shimadzu Corporation
Tetsuya Nagai
G02 - OPTICS