Yasuyuki Hirasaki

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit including built-in self test circuit to test mem...
- Patent number 7,876,633
- Issue date Jan 25, 2011
- Renesas Electronics Corporation
- Yasuyuki Hirasaki
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Integrated circuit including Built-In Self Test circuit to test mem...
- Publication number 20090238018
- Publication date Sep 24, 2009
- NEC Electronics Corporation
- Yasuyuki Hirasaki
- G11 - INFORMATION STORAGE