Yasuyuki Itoh

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of testing a semiconductor device and suctioning a semicondu...
- Patent number 8,759,119
- Issue date Jun 24, 2014
- Fujitsu Semiconductor Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing a semiconductor device and suctioning a semicondu...
- Patent number 8,404,496
- Issue date Mar 26, 2013
- Fujitsu Semiconductor Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having an alignment mark formed by the same ma...
- Patent number 7,112,889
- Issue date Sep 26, 2006
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF TESTING A SEMICONDUCTOR DEVICE AND SUCTIONING A SEMICONDU...
- Publication number 20130171748
- Publication date Jul 4, 2013
- FUJITSU SEMICONDUCTOR LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having an alignment mark formed by the same ma...
- Publication number 20060279003
- Publication date Dec 14, 2006
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING