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Yasuyuki Nozuyama
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for designing semiconductor integrated circuit
Patent number
9,075,946
Issue date
Jul 7, 2015
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Bridge fault removal apparatus, bridge fault removal method, and co...
Patent number
8,886,487
Issue date
Nov 11, 2014
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit and method for designing the same
Patent number
8,508,249
Issue date
Aug 13, 2013
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Delay fault test quality calculation apparatus, delay fault test qu...
Patent number
8,185,863
Issue date
May 22, 2012
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for calculating fault coverage, and fault dete...
Patent number
8,082,534
Issue date
Dec 20, 2011
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Delay fault test quality calculation apparatus, delay fault test qu...
Patent number
8,051,403
Issue date
Nov 1, 2011
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for creating test pattern and calculating fault coverage...
Patent number
7,966,138
Issue date
Jun 21, 2011
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Test quality evaluating and improving system for semiconductor inte...
Patent number
7,913,143
Issue date
Mar 22, 2011
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Test pattern generating apparatus, method for automatically generat...
Patent number
7,406,645
Issue date
Jul 29, 2008
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Fault list and test pattern generating apparatus and method, fault...
Patent number
7,392,146
Issue date
Jun 24, 2008
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Calculation system of fault coverage and calculation method of the...
Patent number
7,308,660
Issue date
Dec 11, 2007
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for analyzing fault of semiconductor integrated circuit,...
Patent number
7,283,918
Issue date
Oct 16, 2007
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for selecting test patterns for logic circuit, computer i...
Patent number
7,162,674
Issue date
Jan 9, 2007
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor integrated circuit device and test method thereof
Patent number
7,139,956
Issue date
Nov 21, 2006
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G11 - INFORMATION STORAGE
Information
Patent Grant
Test system, test method and test program for an integrated circuit...
Patent number
7,096,140
Issue date
Aug 22, 2006
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus connectable to a computer network for circuit design veri...
Patent number
7,093,216
Issue date
Aug 15, 2006
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor integrated circuit device and test method thereof
Patent number
7,082,559
Issue date
Jul 25, 2006
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor integrated circuit including a test facilitation circ...
Patent number
6,834,368
Issue date
Dec 21, 2004
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Test pattern selection apparatus for selecting test pattern from a...
Patent number
6,766,473
Issue date
Jul 20, 2004
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Evaluation device of weighted fault coverage and evaluation method...
Patent number
6,567,946
Issue date
May 20, 2003
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Test-facilitating circuit for information processing devices
Patent number
6,223,312
Issue date
Apr 24, 2001
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of evaluating fault coverage
Patent number
6,151,694
Issue date
Nov 21, 2000
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for minimizing the delay times in a semiconduc...
Patent number
6,148,434
Issue date
Nov 14, 2000
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Current reduction circuit for testing purpose
Patent number
6,101,623
Issue date
Aug 8, 2000
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G11 - INFORMATION STORAGE
Information
Patent Grant
Linear feedback shift register
Patent number
5,867,409
Issue date
Feb 2, 1999
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Data transfer bus including divisional buses connectable by bus swi...
Patent number
5,862,359
Issue date
Jan 19, 1999
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor integrated circuit having function for evaluating AC...
Patent number
5,821,786
Issue date
Oct 13, 1998
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit and its application device
Patent number
5,677,916
Issue date
Oct 14, 1997
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Grant
Information processing system provided with self-diagnosing circuit...
Patent number
5,631,910
Issue date
May 20, 1997
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Current reduction circuit for testing purpose
Patent number
5,592,494
Issue date
Jan 7, 1997
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR DESIGINING THE SAME
Publication number
20130305208
Publication date
Nov 14, 2013
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR DESIGNING THE SAME
Publication number
20120242368
Publication date
Sep 27, 2012
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DELAY FAULT TEST QUALITY CALCULATION APPARATUS, DELAY FAULT TEST QU...
Publication number
20120016619
Publication date
Jan 19, 2012
FUJITSU SEMICONDUCTOR LIMITED
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
BRIDGE FAULT REMOVAL APPARATUS, BRIDGE FAULT REMOVAL METHOD, AND CO...
Publication number
20100204947
Publication date
Aug 12, 2010
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Application
TEST QUALITY EVALUATING AND IMPROVING SYSTEM FOR SEMICONDUCTOR INTE...
Publication number
20090210764
Publication date
Aug 20, 2009
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS FOR CREATING TEST PATTERN AND CALCULATING FAULT COVERAGE...
Publication number
20080262761
Publication date
Oct 23, 2008
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Application
DELAY FAULT TEST QUALITY CALCULATION APPARATUS, DELAY FAULT TEST QU...
Publication number
20080120585
Publication date
May 22, 2008
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FAULT LIST AND TEST PATTERN GENERATING APPARATUS AND METHOD, FAULT...
Publication number
20070260408
Publication date
Nov 8, 2007
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for calculating fault coverage, and fault dete...
Publication number
20070201618
Publication date
Aug 30, 2007
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for analyzing fault of semiconductor integrated circuit,...
Publication number
20070013403
Publication date
Jan 18, 2007
KABUSHIKI KAISHA TOSHIBA
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Application
Test pattern generating apparatus, method for automatically generat...
Publication number
20060005094
Publication date
Jan 5, 2006
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Application
Circuit quality evaluation method and apparatus, circuit quality ev...
Publication number
20050182587
Publication date
Aug 18, 2005
Semiconductor Technology Academic Research Center
Yasuo Sato
G01 - MEASURING TESTING
Information
Patent Application
Test system, test method and test program for an integrated circuit...
Publication number
20050114065
Publication date
May 26, 2005
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit device and test method thereof
Publication number
20050015691
Publication date
Jan 20, 2005
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G11 - INFORMATION STORAGE
Information
Patent Application
Apparatus connectable to a computer network for circuit design veri...
Publication number
20040230928
Publication date
Nov 18, 2004
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Calculation system of fault coverage and calculation method of the...
Publication number
20040205681
Publication date
Oct 14, 2004
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Apparatus for selecting test patterns for logic circuit, computer i...
Publication number
20040133833
Publication date
Jul 8, 2004
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor integrated circuit device and test method thereof
Publication number
20020176288
Publication date
Nov 28, 2002
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor integrated circuit including a test facilitation circ...
Publication number
20020059547
Publication date
May 16, 2002
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING
Information
Patent Application
Test pattern selection apparatus for selecting test pattern from a...
Publication number
20010027539
Publication date
Oct 4, 2001
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G01 - MEASURING TESTING