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Yasuyuki TANABE
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Hamamatsu-shi, Shizuoka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Scanning microscope unit
Patent number
12,216,263
Issue date
Feb 4, 2025
Hamamatsu Photonics K.K.
Jiro Yamashita
G02 - OPTICS
Information
Patent Grant
Confocal microscope unit and confocal microscope
Patent number
12,117,600
Issue date
Oct 15, 2024
Hamamatsu Photonics K.K.
Jiro Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Confocal microscope unit and confocal microscope
Patent number
12,078,789
Issue date
Sep 3, 2024
Hamamatsu Photonics K.K.
Jiro Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Optical measuring device comprising light receiving regions of ligh...
Patent number
10,928,246
Issue date
Feb 23, 2021
Hamamatsu Photonics K.K.
Kengo Suzuki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SCANNING MICROSCOPE UNIT, SCANNING MICROSCOPE, AND CALIBRATION METH...
Publication number
20240231067
Publication date
Jul 11, 2024
Hamamatsu Photonics K.K.
Takashi MIHOYA
G02 - OPTICS
Information
Patent Application
SCANNING MICROSCOPE UNIT, SCANNING MICROSCOPE, AND CALIBRATION METH...
Publication number
20240134177
Publication date
Apr 25, 2024
Hamamatsu Photonics K.K.
Takashi MIHOYA
G02 - OPTICS
Information
Patent Application
CONFOCAL MICROSCOPE UNIT AND CONFOCAL MICROSCOPE
Publication number
20220179185
Publication date
Jun 9, 2022
Hamamatsu Photonics K.K.
Jiro YAMASHITA
G01 - MEASURING TESTING
Information
Patent Application
CONFOCAL MICROSCOPE UNIT AND CONFOCAL MICROSCOPE
Publication number
20220155577
Publication date
May 19, 2022
Hamamatsu Photonics K.K.
Jiro YAMASHITA
G02 - OPTICS
Information
Patent Application
SCANNING MICROSCOPE UNIT
Publication number
20220155576
Publication date
May 19, 2022
Hamamatsu Photonics K.K.
Jiro YAMASHITA
G02 - OPTICS
Information
Patent Application
OPTICAL MEASURING DEVICE
Publication number
20200271511
Publication date
Aug 27, 2020
Hamamatsu Photonics K.K.
Kengo SUZUKI
G01 - MEASURING TESTING