Yasuyuki Taneda

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Inagi-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Ion beam generator
- Patent number 8,378,576
- Issue date Feb 19, 2013
- Canon Anelva Corporation
- Einstein Noel Abarra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 8,324,568
- Issue date Dec 4, 2012
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry and mass spectrometer used for the same
- Patent number 8,309,917
- Issue date Nov 13, 2012
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ION BEAM GENERATOR
- Publication number 20110139998
- Publication date Jun 16, 2011
- Canon ANELVA Corporation
- Einstein Noel ABARRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20100243884
- Publication date Sep 30, 2010
- Canon ANELVA Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY AND MASS SPECTROMETER USED FOR THE SAME
- Publication number 20100163722
- Publication date Jul 1, 2010
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ATTACHMENT MASS SPECTROMETER AND ION ATTACHMENT MASS SPECTROMET...
- Publication number 20090266979
- Publication date Oct 29, 2009
- CANON ANELVA TECHNIX CORPORATION
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS