Yau Kin Hon

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Gilbert, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Microelectromechanical system package and method of testing
- Patent number 9,116,165
- Issue date Aug 25, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Mark E. Schlarmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROELECTROMECHANICAL SYSTEM PACKAGE AND METHOD OF TESTING
- Publication number 20130257445
- Publication date Oct 3, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Mark E. Schlarmann
- G01 - MEASURING TESTING