Membership
Tour
Register
Log in
Yauheni Novikau
Follow
Person
Jena, DE
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method of image evaluation for sim microscopy and sim microscopy me...
Patent number
11,954,831
Issue date
Apr 9, 2024
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for SIM microscopy
Patent number
11,867,894
Issue date
Jan 9, 2024
Ingo Kleppe
G02 - OPTICS
Information
Patent Grant
Method for deconvolving image data
Patent number
11,386,531
Issue date
Jul 12, 2022
Carl Zeiss Microscopy GmbH
Stanislav Kalinin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
High-resolution scanning microscopy
Patent number
11,372,223
Issue date
Jun 28, 2022
Carl Zeiss Microscopy GmbH
Ingo Kleppe
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Accelerated methods and apparatuses for three-dimensional microscop...
Patent number
11,221,297
Issue date
Jan 11, 2022
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
High-resolution scanning microscopy
Patent number
11,209,636
Issue date
Dec 28, 2021
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G02 - OPTICS
Information
Patent Grant
High-resolution scanning microscopy with discrimination between at...
Patent number
11,204,489
Issue date
Dec 21, 2021
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G01 - MEASURING TESTING
Information
Patent Grant
High-resolution 2D microscopy with improved section thickness
Patent number
10,996,452
Issue date
May 4, 2021
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fluctuation-based fluorescence microscopy
Patent number
10,883,940
Issue date
Jan 5, 2021
Carl Zeiss Microscopy GmbH
Thomas Kalkbrenner
G01 - MEASURING TESTING
Information
Patent Grant
High-resolution spectrally selective scanning microscopy of a sample
Patent number
10,649,188
Issue date
May 12, 2020
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G02 - OPTICS
Information
Patent Grant
High-resolution scanning microscopy resolving at least two spectral...
Patent number
10,401,607
Issue date
Sep 3, 2019
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G02 - OPTICS
Information
Patent Grant
High-resolution scanning microscopy
Patent number
10,317,657
Issue date
Jun 11, 2019
Carl Zeiss Microscopy GmbH
Ingo Kleppe
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
High-resolution scanning microscopy
Patent number
10,281,701
Issue date
May 7, 2019
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G02 - OPTICS
Information
Patent Grant
Evaluation of signals of fluorescence scanning microscopy using a c...
Patent number
10,234,667
Issue date
Mar 19, 2019
Carl Zeiss Microscopy GmbH
Yauheni Novikau
G02 - OPTICS
Information
Patent Grant
Method for high-resolution 3D-localization microscopy
Patent number
10,139,611
Issue date
Nov 27, 2018
Carl Zeiss Microscopy GmbH
Yauheni Novikau
G02 - OPTICS
Information
Patent Grant
Scanning microscope and method for determining the point spread fun...
Patent number
10,048,481
Issue date
Aug 14, 2018
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G02 - OPTICS
Information
Patent Grant
Method for high-resolution 3D-localization microscopy
Patent number
10,031,327
Issue date
Jul 24, 2018
Carl Zeiss Microscopy GmbH
Yauheni Novikau
G02 - OPTICS
Information
Patent Grant
High-resolution scanning microscopy
Patent number
9,864,182
Issue date
Jan 9, 2018
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G02 - OPTICS
Information
Patent Grant
High-resolution luminescence microscopy
Patent number
9,726,877
Issue date
Aug 8, 2017
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G02 - OPTICS
Information
Patent Grant
High-resolution luminescence microscopy
Patent number
9,651,766
Issue date
May 16, 2017
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G02 - OPTICS
Information
Patent Grant
Light microscope and microscopy method
Patent number
9,645,375
Issue date
May 9, 2017
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G02 - OPTICS
Information
Patent Grant
Method for generating a microscope image and microscope
Patent number
9,588,045
Issue date
Mar 7, 2017
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G02 - OPTICS
Information
Patent Grant
Microscope system, microscopy method and storage medium
Patent number
8,957,958
Issue date
Feb 17, 2015
Carl Zeiss Microscopy GmbH
Stephan Kuppig
G02 - OPTICS
Information
Patent Grant
Method for evaluating fluorescence correlation spectroscopy measure...
Patent number
8,892,400
Issue date
Nov 18, 2014
Carl Zeiss Microscopy GmbH
Stephan Wagner-Conrad
G01 - MEASURING TESTING
Information
Patent Grant
Microscopy method and microscope with enhanced resolution
Patent number
8,705,172
Issue date
Apr 22, 2014
Carl Zeiss Microscopy GmbH
Ingo Kleppe
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
METHOD, APPARATUS AND SOFTWARE PROGRAM FOR INCREASING RESOLUTION IN...
Publication number
20230143873
Publication date
May 11, 2023
CARL ZEISS MICROSCOPY GMBH
Yauheni NOVIKAU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF IMAGE EVALUATION FOR SIM MICROSCOPY AND SIM MICROSCOPY ME...
Publication number
20220092752
Publication date
Mar 24, 2022
CARL ZEISS MICROSCOPY GMBH
Ingo KLEPPE
G02 - OPTICS
Information
Patent Application
METHOD FOR SIM MICROSCOPY
Publication number
20220075175
Publication date
Mar 10, 2022
CARL ZEISS MICROSCOPY GMBH
Ingo KLEPPE
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SUPER-RESOLUTION EVALUATION OF MICROSCOPE IMAGES ILLUMIN...
Publication number
20220076379
Publication date
Mar 10, 2022
CARL ZEISS MICROSCOPY GMBH
Ingo KLEPPE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MICROSCOPE AND METHOD FOR MICROSCOPIC IMAGE RECORDING WITH VARIABLE...
Publication number
20220043246
Publication date
Feb 10, 2022
CARL ZEISS MICROSCOPY GMBH
Tiemo ANHUT
G02 - OPTICS
Information
Patent Application
METHOD FOR LOCALIZING SIGNAL SOURCES IN LOCALIZATION MICROSCOPY
Publication number
20200300765
Publication date
Sep 24, 2020
Thomas Kalkbrenner
G01 - MEASURING TESTING
Information
Patent Application
Method for deconvolving image data
Publication number
20200294204
Publication date
Sep 17, 2020
CARL ZEISS MICROSCOPY GMBH
Stanislav Kalinin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HIGH-RESOLUTION SCANNING MICROSCOPY
Publication number
20200218047
Publication date
Jul 9, 2020
CARL ZEISS MICROSCOPY GMBH
Ingo Kleppe
G02 - OPTICS
Information
Patent Application
FLUCTUATION-BASED FLUORESCENCE MICROSCOPY
Publication number
20200150044
Publication date
May 14, 2020
CARL ZEISS MICROSCOPY GMBH
Thomas KALKBRENNER
G01 - MEASURING TESTING
Information
Patent Application
ACCELERATED METHODS AND APPARATUSES FOR THREE-DIMENSIONAL MICROSCOP...
Publication number
20200150043
Publication date
May 14, 2020
CARL ZEISS MICROSCOPY GMBH
Ingo Kleppe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HIGH-RESOLUTION SCANNING MICROSCOPY
Publication number
20190258042
Publication date
Aug 22, 2019
CARL ZEISS MICROSCOPY GMBH
Ingo KLEPPE
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
High-Resolution 2D Microscopy with Improved Section Thickness
Publication number
20190064495
Publication date
Feb 28, 2019
CARL ZEISS MICROSCOPY GMBH
Dr. Ingo KLEPPE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HIGH-RESOLUTION SCANNING MICROSCOPY RESOLVING AT LEAST TWO SPECTRAL...
Publication number
20190056580
Publication date
Feb 21, 2019
CARL ZEISS MICROSCOPY GMBH
Ingo KLEPPE
G02 - OPTICS
Information
Patent Application
METHOD FOR HIGH-RESOLUTION 3D-LOCALIZATION MICROSCOPY
Publication number
20180307025
Publication date
Oct 25, 2018
CARL ZEISS MICROSCOPY GMBH
Yauheni Novikau
G02 - OPTICS
Information
Patent Application
HIGH-RESOLUTION SPECTRALLY SELECTIVE SCANNING MICROSCOPY OF A SAMPLE
Publication number
20180196245
Publication date
Jul 12, 2018
CARL ZEISS MICROSCOPY GMBH
Ingo KLEPPE
G02 - OPTICS
Information
Patent Application
EVALUATION OF SIGNALS OF FLUORESCENCE SCANNING MICROSCOPY USING A C...
Publication number
20180113292
Publication date
Apr 26, 2018
CARL ZEISS MICROSCOPY GMBH
Yauheni NOVIKAU
G02 - OPTICS
Information
Patent Application
HIGH-RESOLUTION SCANNING MICROSCOPY WITH DISCRIMINATION BETWEEN AT...
Publication number
20170227749
Publication date
Aug 10, 2017
CARL ZEISS MICROSCOPY GMBH
Ingo KLEPPE
G02 - OPTICS
Information
Patent Application
Scanning Microscope and Method for Determining the Point Spread Fun...
Publication number
20160267658
Publication date
Sep 15, 2016
CARL ZEISS MICROSCOPY GMBH
Ingo KLEPPE
G02 - OPTICS
Information
Patent Application
High-Resolution Scanning Microscopy
Publication number
20160131883
Publication date
May 12, 2016
CARL ZEISS MICROSCOPY GMBH
Ingo KLEPPE
G02 - OPTICS
Information
Patent Application
High-Resolution Scanning Microscopy
Publication number
20150085099
Publication date
Mar 26, 2015
CARL ZEISS MICROSCOPY GMBH
Ingo KLEPPE
G02 - OPTICS
Information
Patent Application
HIGH-RESOLUTION SCANNING MICROSCOPY
Publication number
20150077842
Publication date
Mar 19, 2015
CARL ZEISS MICROSCOPY GMBH
Ingo KLEPPE
G02 - OPTICS
Information
Patent Application
HIGH-RESOLUTION LUMINESCENCE MICROSCOPY
Publication number
20150035964
Publication date
Feb 5, 2015
Ingo Kleppe
G02 - OPTICS
Information
Patent Application
OPTICAL MICROSCOPE AND METHOD FOR EXAMINING A MICROSCOPIC SAMPLE
Publication number
20140293037
Publication date
Oct 2, 2014
CARL ZEISS MICROSCOPY GMBH
Ingo Kleppe
G02 - OPTICS
Information
Patent Application
HIGH-RESOLUTION LUMINESCENCE MICROSCOPY
Publication number
20140184777
Publication date
Jul 3, 2014
CARL ZEISS MICROSCOPY GMBH
Ingo Kleppe
G02 - OPTICS
Information
Patent Application
Method for High-Resolution 3D-Localization Microscopy
Publication number
20140176678
Publication date
Jun 26, 2014
CARL ZEISS MICROSCOPY GMBH
Yauheni Novikau
G02 - OPTICS
Information
Patent Application
Light microscope and microscopy method
Publication number
20140146376
Publication date
May 29, 2014
CARL ZEISS MICROSCOPY GMBH
Ingo Kleppe
G02 - OPTICS
Information
Patent Application
Method for Generating a Microscope Image and Microscope
Publication number
20130068967
Publication date
Mar 21, 2013
Ingo Kleppe
G02 - OPTICS
Information
Patent Application
Microscope System, Microscopy Method and Storage Medium
Publication number
20120081536
Publication date
Apr 5, 2012
Stephan Kuppig
G02 - OPTICS
Information
Patent Application
Microscopy Method and Microscope With Enhanced Resolution
Publication number
20110267688
Publication date
Nov 3, 2011
Ingo Kleppe
G02 - OPTICS
Information
Patent Application
METHOD FOR EVALUATING FLUORESCENCE CORRELATION SPECTROSCOPY MEASURE...
Publication number
20110208478
Publication date
Aug 25, 2011
Stephan WAGNER-CONRAD
G02 - OPTICS