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Yayoi NAKANISHI
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Kobe-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Radar apparatus
Patent number
9,874,634
Issue date
Jan 23, 2018
Fujitsu Ten Limited
Takumi Moriuchi
G01 - MEASURING TESTING
Information
Patent Grant
Radar apparatus and signal processing method
Patent number
9,383,440
Issue date
Jul 5, 2016
Fujitsu Ten Limited
Yayoi Nakanishi
G01 - MEASURING TESTING
Information
Patent Grant
Radar device
Patent number
8,933,834
Issue date
Jan 13, 2015
Fujitsu Ten Limited
Yayoi Nakanishi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RADAR APPARATUS AND SIGNAL PROCESSING METHOD
Publication number
20140118186
Publication date
May 1, 2014
FUJITSU TEN LIMITED
Yayoi NAKANISHI
G01 - MEASURING TESTING
Information
Patent Application
RADAR DEVICE
Publication number
20120112951
Publication date
May 10, 2012
FUJITSU TEN LIMITED
Yayoi NAKANISHI
G01 - MEASURING TESTING