Yazdi Dinshaw Contractor

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Tucson, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit spike check probing apparatus and method
- Patent number 12,169,220
- Issue date Dec 17, 2024
- Texas Instruments Incorporated
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Grant
Visual identification of semiconductor dies
- Patent number 10,431,551
- Issue date Oct 1, 2019
- Texas Instruments Incorporated
- Kenneth Michael Butler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Visual identification of semiconductor dies
- Patent number 9,899,332
- Issue date Feb 20, 2018
- Texas Instruments Incorporated
- Kenneth Michael Butler
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
REUSABLE PROBE CARD WITH REMOVABLE PROBE INSERT
- Publication number 20200386787
- Publication date Dec 10, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Yazdi Dinshaw Contractor
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT SPIKE CHECK PROBING APPARATUS AND METHOD
- Publication number 20200033403
- Publication date Jan 30, 2020
- TEXAS INSTRUMENTS INCORPORATED
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Application
VISUAL IDENTIFICATION OF SEMICONDUCTOR DIES
- Publication number 20180130754
- Publication date May 10, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Kenneth Michael Butler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VISUAL IDENTIFICATION OF SEMICONDUCTOR DIES
- Publication number 20170243831
- Publication date Aug 24, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Kenneth Michael Butler
- H01 - BASIC ELECTRIC ELEMENTS